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N25Q00AA11G1240E PDF预览

N25Q00AA11G1240E

更新时间: 2024-11-06 14:59:03
品牌 Logo 应用领域
镁光 - MICRON /
页数 文件大小 规格书
89页 1248K
描述
Legacy NOR Flash

N25Q00AA11G1240E 数据手册

 浏览型号N25Q00AA11G1240E的Datasheet PDF文件第2页浏览型号N25Q00AA11G1240E的Datasheet PDF文件第3页浏览型号N25Q00AA11G1240E的Datasheet PDF文件第4页浏览型号N25Q00AA11G1240E的Datasheet PDF文件第5页浏览型号N25Q00AA11G1240E的Datasheet PDF文件第6页浏览型号N25Q00AA11G1240E的Datasheet PDF文件第7页 
1Gb, 3V, Multiple I/O Serial NOR Flash Memory  
Features  
Micron Serial NOR Flash Memory  
3V, Multiple I/O, 4KB Sector Erase  
N25Q00AA  
• Write protection  
– Software write protection applicable to every  
64KB sector via volatile lock bit  
– Hardware write protection: protected area size  
defined by five nonvolatile bits (BP0, BP1, BP2,  
BP3, and TB)  
Features  
• Stacked device (four 256Mb die)  
• SPI-compatible serial bus interface  
• Double transfer rate (DTR) mode  
• 2.7–3.6V single supply voltage  
• 108 MHz (MAX) clock frequency supported for all  
protocols in single transfer rate (STR) mode  
• 54 MHz (MAX) clock frequency supported for all  
protocols in DTR mode  
• Dual/quad I/O instruction provides increased  
throughput up to 54 MB/s  
• Supported protocols  
– Extended SPI, dual I/O, and quad I/O  
– DTR mode supported on all  
• Execute-in-place (XIP) mode for all three protocols  
– Configurable via volatile or nonvolatile registers  
– Enables memory to work in XIP mode directly af-  
ter power-on  
• PROGRAM/ERASE SUSPEND operations  
• Available protocols  
– Additional smart protections, available upon re-  
quest  
• Electronic signature  
– JEDEC-standard 2-byte signature (BA21h)  
– Unique ID code (UID): 17 read-only bytes,  
including: Two additional extended device ID  
bytes to identify device factory options; and cus-  
tomized factory data (14 bytes)  
• Minimum 100,000 ERASE cycles per sector  
• More than 20 years data retention  
• Packages – JEDEC-standard, all RoHS-compliant  
– L-PBGA-24b05/6mm x 8mm ( also known as  
LBGA24 )  
– SOP2-16/300 mils (also known as SO16W, SO16-  
Wide, SOIC-16 )  
– Available READ operations  
– Quad or dual output fast read  
– Quad or dual I/O fast read  
• Flexible to fit application  
– Configurable number of dummy cycles  
– Output buffer configurable  
• Software reset  
• 3-byte and 4-byte addressability mode supported  
• 64-byte, user-lockable, one-time programmable  
(OTP) dedicated area  
• Erase capability  
– Subsector erase 4KB uniform granularity blocks  
– Sector erase 64KB uniform granularity blocks  
– Single die erase (32MB)  
PDF: 09005aef8480cede  
n25q_1gb_3V_65nm.pdf - Rev. M 03/14 EN  
Micron Technology, Inc. reserves the right to change products or specifications without notice.  
1
© 2011 Micron Technology, Inc. All rights reserved.  
Products and specifications discussed herein are subject to change by Micron without notice.  

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This tech note describes considerations in thermal applications for Micron memory devices,