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MT55L512Y36FT-11IT PDF预览

MT55L512Y36FT-11IT

更新时间: 2023-07-15 00:00:00
品牌 Logo 应用领域
赛普拉斯 - CYPRESS 静态存储器
页数 文件大小 规格书
34页 468K
描述
SRAM

MT55L512Y36FT-11IT 数据手册

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18Mb: 1 MEG x 18, 512K x 32/36  
FLOW-THROUGH ZBT SRAM  
MT55L1MY18F, MT55V1MV18F,  
MT55L512Y32F, MT55V512V32F,  
MT55L512Y36F, MT55V512V36F  
3.3V VDD, 3.3V or 2.5V I/O; 2.5V VDD, 2.5V I/O  
18Mb ZBT® SRAM  
Features  
Figure 1: 100-Pin TQFP  
JEDEC-Standard MS-026 BHA (LQFP)  
High frequency and 100 percent bus utilization  
Single 3.3V ±± percent or 2.±V ±± percent power  
supply  
Separate 3.3V ±± percent or 2.±V ±± percent isolated  
output buffer supply (VDDQ)  
Advanced control logic for minimum control signal  
interface  
Individual byte write controls may be tied LOW  
Single R/W# (read/write) control pin/ball  
CKE# pin/ball to enable clock and suspend  
operations  
Three chip enables for simple depth expansion  
Clock-controlled and registered addresses, data  
I/Os, and control signals  
Internally self-timed, fully coherent write  
Internally self-timed, registered outputs to  
eliminate the need to control OE#  
SNOOZE MODE for reduced-power standby  
Common data inputs and data outputs  
Linear or Interleaved Burst Modes  
Burst feature (optional)  
Figure 2: 165-Ball FBGA  
JEDEC-Standard MS-216 (Var. CAB-1)  
Pin and ball/function compatibility with 2Mb, 4Mb,  
and 8Mb ZBT SRAM  
TQFP  
Options  
Marking  
Timing (Access/Cycle/MHz)  
6.±ns/8.8ns/113 MHz  
7.±ns/10ns/100 MHz  
8.±ns/11ns/90 MHz  
Configurations  
-8.8  
-10  
-11  
Part Number Example:  
3.3V VDD, 3.3V or 2.±V I/O  
1 Meg x 18  
±12K x 32  
±12K x 36  
2.±V VDD, 2.±V I/O  
1 Meg x 18  
±12K x 32  
±12K x 36  
Packages  
100-pin TQFP  
16±-ball, 13mm x 1±mm FBGA  
Operating Temperature Range  
MT±±L1MY18F  
MT±±L±12Y32F  
MT±±L±12Y36F  
MT55L512Y36FT-11  
General Description  
The Micron® Zero Bus Turnaround(ZBT®) SRAM  
family employs high-speed, low-power CMOS designs  
using an advanced CMOS process.  
MT±±V1MV18F  
MT±±V±12V32F  
MT±±V±12V36F  
Microns 18Mb ZBT SRAMs integrate a 1 Meg x 18,  
±12K x 32, or ±12K x 36 SRAM core with advanced syn-  
chronous peripheral circuitry and  
counter. These SRAMs are optimized for 100 percent  
bus utilization, eliminating any turnaround cycles for  
READ to WRITE, or WRITE to READ, transitions. All  
synchronous inputs pass through registers controlled  
by a positive-edge-triggered single clock input (CLK).  
The synchronous inputs include all addresses, all data  
inputs, chip enable (CE#), two additional chip enables  
T
F1  
a 2-bit burst  
Commercial (0ºC  
?
T
?
+70ºC)  
None  
IT2  
A
Industrial (-40ºC  
?
TA  
?
+8±ºC)  
NOTE:  
1. A Part Marking Guide for the FBGA devices can be found on  
Micron’s Web site—http://www.micron.com/numberguide.  
2. Contact Factory for availability of Industrual Temperature  
devices.  
18Mb: 1 Meg x 18, 512K x 32/36 Flow-through ZBT SRAM  
MT55L1MY18F_16_D.fm – Rev. D, Pub. 2/03  
©2003 Micron Technology, Inc.  
1
PRODUCTS AND SPECIFICATIONS DISCUSSED HEREIN ARE SUBJECT TO CHANGE BY MICRON WITHOUT NOTICE.  

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