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MT44K64M18RB-093E

更新时间： 2024-11-07 14:58:59
品牌 Logo 应用领域
镁光 - MICRON /
页数 文件大小 规格书
132页 1301K
描述
This tech note describes considerations in thermal applications for Micron memory devices, including thermal impedance, thermal resistance, junction temperature, operating temperature, memory reliability, reliability modeling, device reliability, and high-temperature electronics.

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MT44K64M18RB-093E 技术参数

是否Rohs认证： 符合生命周期：Active
Reach Compliance Code：compliantECCN代码：EAR99
风险等级：5.67内存集成电路类型：DDR DRAM
峰值回流温度（摄氏度）：NOT SPECIFIED处于峰值回流温度下的最长时间：NOT SPECIFIED
Base Number Matches：1

MT44K64M18RB-093E 数据手册

 浏览型号MT44K64M18RB-093E的Datasheet PDF文件第2页浏览型号MT44K64M18RB-093E的Datasheet PDF文件第3页浏览型号MT44K64M18RB-093E的Datasheet PDF文件第4页浏览型号MT44K64M18RB-093E的Datasheet PDF文件第5页浏览型号MT44K64M18RB-093E的Datasheet PDF文件第6页浏览型号MT44K64M18RB-093E的Datasheet PDF文件第7页 
Micron Confidential and Proprietary  
4Gb, 8Gb, 16Gb: x8, x16 NAND Flash Memory  
Features  
NAND Flash Memory  
MT29F4G08ABADAH4, MT29F4G08ABADAWP, MT29F4G08ABBDAH4,  
MT29F4G08ABBDAHC, MT29F4G16ABADAH4, MT29F4G16ABADAWP,  
MT29F4G16ABBDAH4, MT29F4G16ABBDAHC, MT29F8G08ADADAH4,  
MT29F8G08ADBDAH4, MT29F8G16ADADAH4, MT29F8G16ADBDAH4,  
MT29F16G08AJADAWP  
• First block (block address 00h) is valid when ship-  
ped from factory with ECC. For minimum required  
ECC, see Error Management.  
• Block 0 requires 1-bit ECC if PROGRAM/ERASE cy-  
cles are less than 1000  
Features  
• Open NAND Flash Interface (ONFI) 1.0-compliant1  
• Single-level cell (SLC) technology  
• Organization  
– Page size x8: 2112 bytes (2048 + 64 bytes)  
– Page size x16: 1056 words (1024 + 32 words)  
– Block size: 64 pages (128K + 4K bytes)  
– Plane size: 2 planes x 2048 blocks per plane  
– Device size: 4Gb: 4096 blocks; 8Gb: 8192 blocks  
16Gb: 16,384 blocks  
• RESET (FFh) required as first command after pow-  
er-on  
• Alternate method of device initialization (Nand_In-  
it) after power up (contact factory)  
• Internal data move operations supported within the  
plane from which data is read  
• Quality and reliability  
– Data retention: 10 years  
– Endurance: 100,000 PROGRAM/ERASE cycles  
• Operating voltage range  
• Asynchronous I/O performance  
–
tRC/tWC: 20ns (3.3V), 25ns (1.8V)  
• Array performance  
– Read page: 25µs 3  
– Program page: 200µs (TYP: 1.8V, 3.3V)3  
– Erase block: 700µs (TYP)  
– VCC: 2.7–3.6V  
– VCC: 1.7–1.95V  
• Operating temperature:  
• Command set: ONFI NAND Flash Protocol  
• Advanced command set  
– Commercial: 0°C to +70°C  
– Industrial (IT): –40ºC to +85ºC  
• Package  
– Program page cache mode4  
– Read page cache mode 4  
– 48-pin TSOP type 1, CPL2  
– 63-ball VFBGA  
– One-time programmable (OTP) mode  
– Two-plane commands 4  
– Interleaved die (LUN) operations  
– Read unique ID  
– Block lock (1.8V only)  
– Internal data move  
• Operation status byte provides software method for  
detecting  
1. The ONFI 1.0 specification is available at  
www.onfi.org.  
Notes:  
2. CPL = Center parting line.  
3. See Program and Erase Characteristics for  
tR_ECC and tPROG_ECC specifications.  
4. These commands supported only with ECC  
disabled.  
– Operation completion  
– Pass/fail condition  
– Write-protect status  
• Ready/Busy# (R/B#) signal provides a hardware  
method of detecting operation completion  
• WP# signal: Write protect entire device  
PDF: 09005aef83b25735  
m60a_4gb_8gb_16gb_ecc_nand.pdf - Rev. N 10/12 EN  
Micron Technology, Inc. reserves the right to change products or specifications without notice.  
1
© 2009 Micron Technology, Inc. All rights reserved.  
Products and specifications discussed herein are subject to change by Micron without notice.  
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