品牌 | Logo | 应用领域 |
镁光 - MICRON | / | |
页数 | 文件大小 | 规格书 |
132页 | 1301K | |
描述 | ||
This tech note describes considerations in thermal applications for Micron memory devices, including thermal impedance, thermal resistance, junction temperature, operating temperature, memory reliability, reliability modeling, device reliability, and high-temperature electronics. |
是否Rohs认证: | 符合 | 生命周期: | Active |
包装说明: | TSOP1, TSSOP48,.8,20 | Reach Compliance Code: | compliant |
风险等级: | 5.75 | 最长访问时间: | 20 ns |
其他特性: | SEATED HGT_CALCULATED | JESD-30 代码: | R-PDSO-G48 |
长度: | 18.4 mm | 内存密度: | 34359738368 bit |
内存集成电路类型: | FLASH | 内存宽度: | 8 |
功能数量: | 1 | 部门数/规模: | 4K |
端子数量: | 48 | 字数: | 4294967296 words |
字数代码: | 4000000000 | 工作模式: | ASYNCHRONOUS |
最高工作温度: | 85 °C | 最低工作温度: | -40 °C |
组织: | 4GX8 | 封装主体材料: | PLASTIC/EPOXY |
封装代码: | TSOP1 | 封装等效代码: | TSSOP48,.8,20 |
封装形状: | RECTANGULAR | 封装形式: | SMALL OUTLINE, THIN PROFILE |
页面大小: | 8K words | 并行/串行: | PARALLEL |
峰值回流温度(摄氏度): | NOT SPECIFIED | 编程电压: | 3.3 V |
就绪/忙碌: | YES | 反向引出线: | NO |
座面最大高度: | 1.2 mm | 部门规模: | 1M |
最大待机电流: | 0.00005 A | 最大压摆率: | 0.05 mA |
最大供电电压 (Vsup): | 3.6 V | 最小供电电压 (Vsup): | 2.7 V |
标称供电电压 (Vsup): | 3.3 V | 表面贴装: | YES |
技术: | CMOS | 温度等级: | INDUSTRIAL |
端子形式: | GULL WING | 端子节距: | 0.5 mm |
端子位置: | DUAL | 处于峰值回流温度下的最长时间: | NOT SPECIFIED |
切换位: | YES | 类型: | SLC NAND TYPE |
宽度: | 12 mm | Base Number Matches: | 1 |
型号 | 品牌 | 获取价格 | 描述 | 数据表 |
MT29F32G08ABAAAWP-Z | MICRON |
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This tech note describes considerations in thermal applications for Micron memory devices, | |
MT29F32G08ABCABH1-10ITZ | MICRON |
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This tech note describes considerations in thermal applications for Micron memory devices, | |
MT29F32G08ABCABH1-10Z | MICRON |
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This tech note describes considerations in thermal applications for Micron memory devices, | |
MT29F32G08ABCDBJ4-6 | MICRON |
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This tech note describes considerations in thermal applications for Micron memory devices, | |
MT29F32G08ABEABM73A3WC1 | MICRON |
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This tech note describes considerations in thermal applications for Micron memory devices, | |
MT29F32G08AFABAWP-IT | MICRON |
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This tech note describes considerations in thermal applications for Micron memory devices, | |
MT29F32G08AFACAWP-Z | MICRON |
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This tech note describes considerations in thermal applications for Micron memory devices, | |
MT29F32G08CBACA | MICRON |
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Micron Confidential and Proprietary | |
MT29F32G08CBACAWP-Z | MICRON |
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Anticipating electrostatic discharge (ESD) technology roadmap trends with ESD control hard | |
MT29F32G08CBADAL83A3WC1 | MICRON |
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Anticipating electrostatic discharge (ESD) technology roadmap trends with ESD control hard |