Document Number: MRF6S9125
Rev. 1, 7/2005
Freescale Semiconductor
Technical Data
RF Power Field Effect Transistors
N-Channel Enhancement-Mode Lateral MOSFETs
Designed for broadband commercial and industrial applications with
frequencies up to 1000 MHz. The high gain and broadband performance of
these devices make them ideal for large-signal, common-source amplifier
applications in 28 volt base station equipment.
MRF6S9125NR1
MRF6S9125NBR1
MRF6S9125MR1
MRF6S9125MBR1
N-CDMA Application
• Typical Single-Carrier N-CDMA Performance: VDD = 28 Volts, IDQ
=
950 mA, Pout = 27 Watt Avg., Full Frequency Band (865-895 MHz), IS-95
CDMA (Pilot, Sync, Paging, Traffic Codes 8 Through 13) Channel
Bandwidth = 1.2288 MHz. PAR = 9.8 dB @ 0.01% Probability on CCDF.
Power Gain — 20.2 dB
Drain Efficiency — 31%
ACPR @ 750 kHz Offset = -47.1 dBc @ 30 kHz Bandwidth
880 MHz, 27 W AVG., 28 V
SINGLE N-CDMA
GSM EDGE Application
LATERAL N-CHANNEL
RF POWER MOSFETs
• Typical GSM EDGE Performance: VDD = 28 Volts, IDQ = 700 mA,
P
out = 60 Watts Avg., Full Frequency Band (865-895 MHz or
921-960 MHz)
Power Gain — 20 dB
Drain Efficiency — 40% (Typ)
Spectral Regrowth @ 400 kHz Offset = -63 dBc
Spectral Regrowth @ 600 kHz Offset = -78 dBc
EVM — 1.5% rms
CASE 1486-03, STYLE 1
TO-270 WB-4
PLASTIC
MRF6S9125NR1(MR1)
GSM Application
• Typical GSM Performance: VDD = 28 Volts, IDQ = 700 mA, Pout
125 Watts, Full Frequency Band (921-960 MHz)
Power Gain — 19 dB
=
Drain Efficiency — 62%
• Capable of Handling 10:1 VSWR, @ 28 Vdc, @ P1dB Output Power,
@ f = 880 MHz
• Characterized with Series Equivalent Large-Signal Impedance Parameters
• Internally Matched for Ease of Use
• Qualified Up to a Maximum of 32 VDD Operation
• Integrated ESD Protection
CASE 1484-02, STYLE 1
TO-272 WB-4
PLASTIC
MRF6S9125NBR1(MBR1)
• N Suffix Indicates Lead-Free Terminations
• 200°C Capable Plastic Package
• In Tape and Reel. R1 Suffix = 500 Units per 44 mm, 13 inch Reel.
Table 1. Maximum Ratings
Rating
Symbol
Value
Unit
Vdc
Vdc
Drain-Source Voltage
Gate-Source Voltage
V
-0.5, +68
-0.5, +12
DSS
V
GS
Total Device Dissipation @ T = 25°C
Derate above 25°C
P
398
2.3
W
W/°C
C
D
Storage Temperature Range
Operating Junction Temperature
T
- 65 to +150
200
°C
°C
stg
T
J
NOTE - CAUTION - MOS devices are susceptible to damage from electrostatic charge. Reasonable precautions in handling and
packaging MOS devices should be observed.
Freescale Semiconductor, Inc., 2005. All rights reserved.
MRF6S9125NR1 MRF6S9125NBR1 MRF6S9125MR1 MRF6S9125MBR1
RF Device Data
Freescale Semiconductor
1