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MRF18085ALSR3 PDF预览

MRF18085ALSR3

更新时间: 2024-09-26 22:37:27
品牌 Logo 应用领域
摩托罗拉 - MOTOROLA 晶体晶体管功率场效应晶体管射频
页数 文件大小 规格书
8页 379K
描述
RF Power Field Effect Transistors

MRF18085ALSR3 数据手册

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MRF18085A  
Rev. 4, 12/2004  
Freescale Semiconductor  
Technical Data  
RF Power Field Effect Transistors  
N-Channel Enhancement-Mode Lateral MOSFETs  
MRF18085AR3  
Designed for GSM and GSM EDGE base station applications with  
frequencies from 1800 to 2000 MHz. Suitable for TDMA, CDMA and  
multicarrier amplifier applications. To be used in Class AB for PCN-PCS/  
cellular radio and WLL applications. Specified for GSM - GSM EDGE  
1805-1880 MHz.  
MRF18085ALSR3  
1800-1880 MHz, 85 W, 26 V  
GSM/GSM EDGE  
LATERAL N-CHANNEL  
RF POWER MOSFETs  
GSM and GSM EDGE Performance, Full Frequency Band  
(1805-1880 MHz)  
Power Gain - 15 dB (Typ) @ 85 Watts CW  
Efficiency - 52% (Typ) @ 85 Watts CW  
Internally Matched, Controlled Q, for Ease of Use  
High Gain, High Efficiency and High Linearity  
Integrated ESD Protection  
Designed for Maximum Gain and Insertion Phase Flatness  
Capable of Handling 5:1 VSWR, @ 26 Vdc, @ P1dB Output Power,  
@ f = 1805 MHz  
Excellent Thermal Stability  
Characterized with Series Equivalent Large-Signal Impedance Parameters  
CASE 465-06, STYLE 1  
NI-780  
MRF18085AR3  
Available with Low Gold Plating Thickness on Leads. L Suffix Indicates  
40µ″ Nominal.  
In Tape and Reel. R3 Suffix = 250 Units per 56 mm, 13 inch Reel.  
CASE 465A-06, STYLE 1  
NI-780S  
MRF18085ALSR3  
Table 1. Maximum Ratings  
Rating  
Symbol  
Value  
Unit  
Drain-Source Voltage  
Gate-Source Voltage  
V
-0.5, +65  
-0.5, +15  
Vdc  
Vdc  
DSS  
V
GS  
Total Device Dissipation @ T = 25°C  
Derate above 25°C  
P
D
273  
1.56  
W
W/°C  
C
Storage Temperature Range  
Operating Junction Temperature  
T
- 65 to +150  
200  
°C  
°C  
stg  
T
J
Table 2. Thermal Characteristics  
Characteristic  
(1)  
Symbol  
Value  
Unit  
Thermal Resistance, Junction to Case  
R
0.79  
°C/W  
θ
JC  
Table 3. ESD Protection Characteristics  
Test Conditions  
Class  
Human Body Model  
1 (Minimum)  
M3 (Minimum)  
Machine Model  
1. Refer to AN1955/D, Thermal Measurement Methodology of RF Power Amplifiers. Go to http://www.freescale.com/rf.  
Select Documentation/Application Notes - AN1955.  
NOTE - CAUTION - MOS devices are susceptible to damage from electrostatic charge. Reasonable precautions in handling and  
packaging MOS devices should be observed.  
Freescale Semiconductor, Inc., 2004. All rights reserved.  

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