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MRF166C PDF预览

MRF166C

更新时间: 2024-11-19 22:45:59
品牌 Logo 应用领域
泰科 - TE 晶体晶体管射频放大器局域网
页数 文件大小 规格书
9页 178K
描述
MOSFET BROADBAND RF POWER FETs

MRF166C 技术参数

是否Rohs认证: 符合生命周期:Transferred
针数:6Reach Compliance Code:unknown
ECCN代码:EAR99风险等级:5.3
Is Samacsys:N配置:SINGLE
最小漏源击穿电压:65 V最大漏极电流 (ID):4 A
FET 技术:METAL-OXIDE SEMICONDUCTOR最高频带:ULTRA HIGH FREQUENCY BAND
JESD-30 代码:R-CDFM-F6元件数量:1
端子数量:6工作模式:ENHANCEMENT MODE
封装主体材料:CERAMIC, METAL-SEALED COFIRED封装形状:RECTANGULAR
封装形式:FLANGE MOUNT峰值回流温度(摄氏度):NOT SPECIFIED
极性/信道类型:N-CHANNEL认证状态:Not Qualified
表面贴装:YES端子形式:FLAT
端子位置:DUAL处于峰值回流温度下的最长时间:NOT SPECIFIED
晶体管应用:AMPLIFIER晶体管元件材料:SILICON
Base Number Matches:1

MRF166C 数据手册

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Order this document  
SEMICONDUCTOR TECHNICAL DATA  
by MRF166C/D  
The RF MOSFET Line  
N–Channel Enhancement Mode MOSFETs  
Designed primarily for wideband large–signal output and driver from 30500  
MHz.  
MRF166C — Guaranteed Performance at 500 MHz, 28 Vdc  
Output Power = 20 W  
20 W, 500 MHz  
MOSFET  
Gain = 13.5 dB  
Efficiency = 50%  
BROADBAND  
RF POWER FETs  
Replacement for Industry Standards such as MRF136, DV2820, BLF244,  
SD1902, and ST1001  
100% Tested for Load Mismatch at all Phase Angles with 30:1 VSWR  
Facilitates Manual Gain Control, ALC and Modulation Techniques  
Excellent Thermal Stability, Ideally Suited for Class A Operation  
Low C  
rss  
— 4.0 pF @ V  
= 28 V  
DS  
Circuit board photomaster available upon request by  
contacting RF Tactical Marketing in Phoenix, AZ.  
D
CASE 319–07, STYLE 3  
G
S
MAXIMUM RATINGS  
Rating  
Symbol  
Value  
65  
Unit  
Vdc  
Vdc  
Drain–Gate Voltage  
Drain–Gate Voltage  
V
DSS  
V
DGR  
65  
(R  
= 1.0 M)  
GS  
Gate–Source Voltage  
V
±20  
Adc  
Adc  
GS  
Drain Current — Continuous  
I
4.0  
D
Total Device Dissipation @ T = 25°C  
Derate Above 25°C  
P
D
70  
0.4  
Watts  
W/°C  
C
Storage Temperature Range  
Operating Junction Temperature  
T
65 to 150  
200  
°C  
°C  
stg  
T
J
THERMAL CHARACTERISTICS  
Characteristic  
Symbol  
Max  
Unit  
Thermal Resistance, Junction to Case  
R
2.5  
°C/W  
θJC  
NOTE — CAUTION — MOS devices are susceptible to damage from electrostatic charge. Reasonable precautions in handling and  
packaging MOS devices should be observed.  
REV 10  
1

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