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MRF1511NT1_08 PDF预览

MRF1511NT1_08

更新时间: 2022-04-23 23:00:11
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页数 文件大小 规格书
14页 465K
描述
RF Power Field Effect Transistor

MRF1511NT1_08 数据手册

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Document Number: MRF1511N  
Rev. 7, 6/2008  
Freescale Semiconductor  
Technical Data  
RF Power Field Effect Transistor  
N-Channel Enhancement-Mode Lateral MOSFET  
Designed for broadband commercial and industrial applications at frequen-  
cies to 175 MHz. The high gain and broadband performance of this device  
makes it ideal for large-signal, common source amplifier applications in 7.5 volt  
portable FM equipment.  
MRF1511NT1  
D
Specified Performance @ 175 MHz, 7.5 Volts  
Output Power — 8 Watts  
Power Gain — 13 dB  
Efficiency — 70%  
175 MHz, 8 W, 7.5 V  
LATERAL N-CHANNEL  
BROADBAND  
Capable of Handling 20:1 VSWR, @ 9.5 Vdc,  
175 MHz, 2 dB Overdrive  
RF POWER MOSFET  
Features  
Excellent Thermal Stability  
G
Characterized with Series Equivalent Large-Signal  
Impedance Parameters  
N Suffix Indicates Lead-Free Terminations. RoHS Compliant.  
S
In Tape and Reel. T1 Suffix = 1,000 Units per 12 mm,  
7 inch Reel.  
CASE 466-03, STYLE 1  
PLD-1.5  
PLASTIC  
Table 1. Maximum Ratings  
Rating  
Symbol  
Value  
-0.5, +40  
20  
Unit  
Vdc  
Vdc  
Adc  
Drain-Source Voltage  
Gate-Source Voltage  
V
DSS  
V
GS  
Drain Current — Continuous  
I
4
D
(1)  
Total Device Dissipation @ T = 25°C  
Derate above 25°C  
P
62.5  
0.5  
W
W/°C  
C
D
Storage Temperature Range  
Operating Junction Temperature  
Table 2. Thermal Characteristics  
T
- 65 to +150  
150  
°C  
°C  
stg  
T
J
(2)  
Characteristic  
Symbol  
Value  
Unit  
Thermal Resistance, Junction to Case  
Table 3. Moisture Sensitivity Level  
Test Methodology  
R
2
°C/W  
θ
JC  
Rating  
Package Peak Temperature  
Unit  
Per JESD 22-A113, IPC/JEDEC J-STD-020  
1
260  
°C  
T
T
C
J –  
1. Calculated based on the formula P  
=
D
R
θJC  
2. MTTF calculator available at http://www.freescale.com/rf. Select Software & Tools/Development Tools/Calculators to access MTTF  
calculators by product.  
NOTE - CAUTION - MOS devices are susceptible to damage from electrostatic charge. Reasonable precautions in handling and  
packaging MOS devices should be observed.  
© Freescale Semiconductor, Inc., 2008. All rights reserved.  

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