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MRF1511NT1 PDF预览

MRF1511NT1

更新时间: 2024-11-19 04:39:07
品牌 Logo 应用领域
飞思卡尔 - FREESCALE 晶体晶体管功率场效应晶体管射频放大器PC
页数 文件大小 规格书
12页 226K
描述
RF Power Field Effect Transistor

MRF1511NT1 数据手册

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MRF1511  
Rev. 3, 3/2005  
Freescale Semiconductor  
Technical Data  
RF Power Field Effect Transistor  
NChannel EnhancementMode Lateral MOSFET  
MRF1511NT1  
MRF1511T1  
Designed for broadband commercial and industrial applications at frequen-  
cies to 175 MHz. The high gain and broadband performance of this device  
makes it ideal for largesignal, common source amplifier applications in 7.5 volt  
portable FM equipment.  
Specified Performance @ 175 MHz, 7.5 Volts  
Output Power — 8 Watts  
Power Gain — 11.5 dB  
Efficiency — 55%  
175 MHz, 8 W, 7.5 V  
LATERAL NCHANNEL  
BROADBAND  
Capable of Handling 20:1 VSWR, @ 9.5 Vdc,  
175 MHz, 2 dB Overdrive  
RF POWER MOSFET  
Excellent Thermal Stability  
Characterized with Series Equivalent LargeSignal  
Impedance Parameters  
Broadband UHF/VHF Demonstration Amplifier Information  
Available Upon Request  
RF Power Plastic Surface Mount Package  
N Suffix Indicates LeadFree Terminations  
Available in Tape and Reel.  
CASE 46603, STYLE 1  
PLD1.5  
T1 Suffix = 1,000 Units per 12 mm, 7 Inch Reel.  
PLASTIC  
Table 1. Maximum Ratings  
Rating  
Symbol  
Value  
0.5, +40  
±20  
Unit  
Vdc  
Vdc  
Adc  
DrainSource Voltage  
GateSource Voltage  
V
DSS  
V
GS  
Drain Current — Continuous  
I
D
4
(1)  
Total Device Dissipation @ T = 25°C  
Derate above 25°C  
P
D
62.5  
0.5  
W
W/°C  
C
Storage Temperature Range  
Operating Junction Temperature  
Table 2. Thermal Characteristics  
T
65 to +150  
°C  
°C  
stg  
T
150  
J
Characteristic  
Symbol  
Value  
Unit  
Thermal Resistance, Junction to Case  
Table 3. Moisture Sensitivity Level  
Test Methodology  
R
2
°C/W  
θ
JC  
Rating  
Package Peak Temperature  
Unit  
Per JESD 22A113, IPC/JEDEC JSTD020  
1
260  
°C  
T
T
C
J –  
1. Calculated based on the formula P  
=
D
R
θJC  
NOTE CAUTION MOS devices are susceptible to damage from electrostatic charge. Reasonable precautions in handling and  
packaging MOS devices should be observed.  
© Freescale Semiconductor, Inc., 2005. All rights reserved.  

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