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NE556D

更新时间: 2024-02-14 13:01:25
品牌 Logo 应用领域
摩托罗拉 - MOTOROLA 模拟波形发生功能信号电路光电二极管
页数 文件大小 规格书
10页 204K
描述
DUAL TIMING CIRCUIT

NE556D 技术参数

是否Rohs认证: 不符合生命周期:Obsolete
包装说明:DIP, DIP14,.3Reach Compliance Code:unknown
风险等级:5.92JESD-30 代码:R-PDIP-T14
JESD-609代码:e0端子数量:14
最高工作温度:70 °C最低工作温度:
封装主体材料:PLASTIC/EPOXY封装代码:DIP
封装等效代码:DIP14,.3封装形状:RECTANGULAR
封装形式:IN-LINE电源:5/15 V
子类别:Analog Waveform Generation Functions表面贴装:NO
技术:BIPOLAR温度等级:COMMERCIAL
端子面层:Tin/Lead (Sn/Pb)端子形式:THROUGH-HOLE
端子节距:2.54 mm端子位置:DUAL
Base Number Matches:1

NE556D 数据手册

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Order this document by MC3456/D  
The MC3456 dual timing circuit is a highly stable controller capable of  
producing accurate time delays, or oscillation. Additional terminals are  
provided for triggering or resetting if desired. In the time delay mode of  
operation, the time is precisely controlled by one external resistor and  
capacitor per timer. For astable operation as an oscillator, the free running  
frequency and the duty cycle are both accurately controlled with two external  
resistors and one capacitor per timer. The circuit may be triggered and reset  
on falling waveforms, and the output structure can source or sink up to  
200 mA or drive MTTL circuits.  
DUAL TIMING CIRCUIT  
SEMICONDUCTOR  
TECHNICAL DATA  
Direct Replacement for NE556/SE556 Timers  
Timing from Microseconds through Hours  
Operates in Both Astable and Monostable Modes  
Adjustable Duty Cycle  
P SUFFIX  
PLASTIC PACKAGE  
CASE 646  
D SUFFIX  
PLASTIC PACKAGE  
CASE 751  
(SO–14)  
High Current Output can Source or Sink 200 mA  
Output can Drive MTTL  
Temperature Stability of 0.005% per °C  
Normally “On” or Normally “Off” Output  
Dual Version of the Popular MC1455 Timer  
PIN CONNECTIONS  
1
2
3
14  
Discharge A  
Threshold A  
V
CC  
13  
12  
Discharge B  
Figure 1. 22 Second Solid State Time Delay Relay Circuit  
Control A  
Reset A  
Output A  
Trigger A  
Gnd  
Threshold B  
Control B  
Reset B  
4
5
6
7
11  
10  
9
1.0 k  
Load  
MT2  
3
8
Output B  
Trigger B  
MT1  
6
G
4
2
10 k  
R
20 M  
C
1/2  
MC3456  
8
7
5
F
(Top View)  
1.0 µF  
0.1 µF  
0.01  
µ
1
1N4003  
–10 V  
ORDERING INFORMATION  
Operating  
3.5 k  
250 V  
t = 1.1; R and C = 22 sec  
Time delay (t) is variable by  
changing R and C (see Figure 16).  
1N4740  
10  
+
µF  
Temperature Range  
Device  
MC3456P  
NE556D  
Package  
Plastic DIP  
SO–14  
0° to +70°C  
Figure 3. General Test Circuit  
V
CC  
I
CC  
V
R
Figure 2. Block Diagram (1/2 Shown)  
Reset  
4
8
700  
V
CC  
14  
7
5
V
CC  
+
F
Control  
Voltage  
0.01  
µ
Discharge  
1/2  
5 k  
MC3456  
1 (13)  
2 (12)  
Threshold  
3
Threshold  
6
Discharge  
Output  
+
V
Comp  
S
Flip  
Flop  
2.0 k  
Output  
3 (11)  
Control Voltage  
I
A
th  
R
S
Gnd  
1
Trigger  
I
I
V
Sink  
O
Q
2
5 k  
5 k  
Source  
5 (9)  
Inhibit/  
Reset  
+
Comp  
B
6 (8)  
Trigger  
Test circuit for measuring DC parameters (to set output and measure parameters):  
a) When V  
b) When V  
2/3 V , V is low.  
S
S
CC O  
1/3 V , V is high.  
CC  
O
7
4 (10)  
Reset  
c) When V is low, Pin 7 sinks current. To test for Reset, set V high,  
O
O
Gnd  
c) apply Reset voltage, and test for current flowing into Pin 7. When Reset  
c) is not in use, it should be tied to V  
.
CC  
Motorola, Inc. 1996  
Rev 2  

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