MNP0008
Silicon NIP Diode
Rev. V3
Features
Rugged Construction
Fully Passivated
Low Leakage
Available in Both Chip and Package Styles
Screening per MIL-PRF-19500 and MIL-PRF-
38534 Available
Description
The MNP0008 Series are silicon NIP diodes that
features a fully passivated mesa construction for low
leakage and reliability.
Electrical Specifications: TC = +25°C
Parameter
Test Conditions
Units
Min.
Typ.
Max.
Voltage Breakdown
IR = 10 µA
V
100
—
—
Junction Capacitance
DIE Package (C12p)
VR = 10 V, 1 MHz
pF
—
0.08
0.12
Total Capacitance
Package Style:
ET47p
0.48
0.28
0.21
0.33
0.60
0.37
0.29
0.43
VR = 10 V, 1 MHz
pF
—
T54p
T55p
T89p
Series Resistance
Lifetime
IF = 10 mA, 500 MHz
IF = 10 mA, IR = 6 mA, 50%
—
Ω
ns
—
—
—
2.0
150
10
2.5
—
I Layer
µm
—
Absolute Maximum Ratings1,2
Parameter
Reverse Voltage
Absolute Maximum
100 V
Thermal Resistance
+50°C/W
Operating & Storage Temperature
-65°C to +150°C
1. Exceeding any one or combination of these limits may cause permanent damage to this device.
2. MACOM does not recommend sustained operation near these survivability limits.
1
MACOM Technology Solutions Inc. (MACOM) and its affiliates reserve the right to make changes to the product(s) or information contained herein without notice.
Visit www.macom.com for additional data sheets and product information.
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DC-0014084