MCR25D, MCR25M, MCR25N
Preferred Device
Silicon Controlled Rectifiers
Reverse Blocking Thyristors
Designed primarily for half−wave ac control applications, such as
motor controls, heating controls, and power supplies; or wherever
half−wave, silicon gate−controlled devices are needed.
http://onsemi.com
Features
SCRs
25 AMPERES RMS
400 thru 800 VOLTS
• Blocking Voltage to 800 Volts
• On-State Current Rating of 25 Amperes RMS
• High Surge Current Capability − 300 Amperes
• Rugged, Economical TO−220AB Package
G
A
K
• Glass Passivated Junctions for Reliability and Uniformity
• Minimum and Maximum Values of I , V , and I Specified for
GT GT
H
MARKING
DIAGRAM
Ease of Design
• High Immunity to dv/dt − 100 V/msec Minimum @ 125°C
• Pb−Free Packages are Available*
MAXIMUM RATINGS (T = 25°C unless otherwise noted)
AY WW
MCR25xG
AKA
J
Rating
Symbol
Value
Unit
Peak Repetitive Off−State Voltage (Note 1)
V
V
V
DRM,
RRM
TO−220AB
CASE 221A−09
STYLE 3
(T = −40 to 125°C, Sine Wave,
J
1
2
50 to 60 Hz, Gate Open)
MCR25D
MCR25M
MCR25N
400
600
800
3
A
Y
= Assembly Location
= Year
On-State RMS Current
I
25
A
A
T(RMS)
(180° Conduction Angles; T = 80°C)
WW = Work Week
C
x
G
= D, M, or N
Peak Non-repetitive Surge Current
I
300
TSM
= Pb−Free Package
(1/2 Cycle, Sine Wave 60 Hz, T = 125°C)
J
AKA = Diode Polarity
2
2
Circuit Fusing Consideration (t = 8.3 ms)
I t
373
A sec
PIN ASSIGNMENT
Cathode
Forward Peak Gate Power
P
20.0
W
W
A
GM
(Pulse Width ≤ 1.0 ms, T = 80°C)
C
1
Forward Average Gate Power
P
0.5
2.0
G(AV)
2
3
4
Anode
(t = 8.3 ms, T = 80°C)
C
Gate
Forward Peak Gate Current
I
GM
Anode
(Pulse Width ≤ 1.0 ms, T = 80°C)
C
Operating Junction Temperature Range
Storage Temperature Range
T
−40 to +125
−40 to +150
°C
°C
J
ORDERING INFORMATION
T
stg
Device
Package
Shipping
Maximum ratings are those values beyond which device damage can occur.
Maximum ratings applied to the device are individual stress limit values (not
normal operating conditions) and are not valid simultaneously. If these limits are
exceeded, device functional operation is not implied, damage may occur and
reliability may be affected.
MCR25D
TO−220AB
50 Units / Rail
50 Units / Rail
MCR25DG
TO−220AB
(Pb−Free)
MCR25M
TO−220AB
50 Units / Rail
50 Units / Rail
1. V
and V
for all types can be applied on a continuous basis. Ratings
DRM
RRM
apply for zero or negative gate voltage; positive gate voltage shall not be
applied concurrent with negative potential on the anode. Blocking voltages
shall not be tested with a constant current source such that the voltage ratings
of the devices are exceeded.
MCR25MG
TO−220AB
(Pb−Free)
MCR25N
TO−220AB
50 Units / Rail
50 Units / Rail
MCR25NG
TO−220AB
(Pb−Free)
*For additional information on our Pb−Free strategy and soldering details, please
download the ON Semiconductor Soldering and Mounting Techniques
Reference Manual, SOLDERRM/D.
Preferred devices are recommended choices for future use
and best overall value.
©
Semiconductor Components Industries, LLC, 2005
1
Publication Order Number:
December, 2005 − Rev. 5
MCR25/D