MCR12DSM, MCR12DSN
Preferred Device
Sensitive Gate Silicon
Controlled Rectifiers
Reverse Blocking Thyristors
Designed for high volume, low cost, industrial and consumer
applications such as motor control; process control; temperature, light
and speed control.
http://onsemi.com
SCRs
12 AMPERES RMS
600 − 800 VOLTS
Features
• Small Size
• Passivated Die for Reliability and Uniformity
• Low Level Triggering and Holding Characteristics
• Epoxy Meets UL 94 V−0 @ 0.125 in
G
A
K
• ESD Ratings:
Human Body Model, 3B u 8000 V
Machine Model, C u 400 V
• Pb−Free Packages are Available
MARKING
DIAGRAMS
MAXIMUM RATINGS (T = 25°C unless otherwise noted)
J
4
Rating
Symbol
Value
Unit
DPAK
CASE 369C
STYLE 4
YWW
R1
2DSxG
Peak Repetitive Off−State Voltage (Note 1)
V
V
DRM,
(T = −40 to 110°C, Sine Wave, 50 to 60 Hz,
2
V
1
J
RRM
Gate Open)
MCR12DSM
MCR12DSN
3
600
800
On−State RMS Current
(180° Conduction Angles; T = 75°C)
I
12
7.6
100
A
A
A
T(RMS)
4
C
DPAK−3
CASE 369D
STYLE 4
YWW
R1
2DSxG
Average On−State Current
(180° Conduction Angles; T = 75°C)
I
T(AV)
C
1
Peak Non-Repetitive Surge Current
(1/2 Cycle, Sine Wave 60 Hz, T = 110°C)
I
TSM
2
J
3
2
2
Circuit Fusing Consideration (t = 8.3 msec)
I t
41
A sec
Y
WW
= Year
= Work Week
Forward Peak Gate Power
P
5.0
W
W
A
GM
(Pulse Width ≤ 1.0 ꢀ sec, T = 75°C)
C
R12DSx = Device Code
x= M or N
G
Forward Average Gate Power
P
0.5
2.0
G(AV)
(t = 8.3 msec, T = 75°C)
= Pb−Free Package
C
Forward Peak Gate Current
I
GM
(Pulse Width ≤ 1.0 ꢀ sec, T = 75°C)
C
PIN ASSIGNMENT
Cathode
Operating Junction Temperature Range
Storage Temperature Range
T
−40 to 110
−40 to 150
°C
°C
J
1
T
stg
2
3
4
Anode
Maximum ratings are those values beyond which device damage can occur.
Maximum ratings applied to the device are individual stress limit values (not
normal operating conditions) and are not valid simultaneously. If these limits are
exceeded, device functional operation is not implied, damage may occur and
reliability may be affected.
Gate
Anode
1. V
and V
for all types can be applied on a continuous basis. Ratings
DRM
RRM
ORDERING INFORMATION
See detailed ordering and shipping information in the package
dimensions section on page 5 of this data sheet.
apply for zero or negative gate voltage; however, positive gate voltage shall
not be applied concurrent with negative potential on the anode. Blocking
voltages shall not be tested with a constant current source such that the
voltage ratings of the device are exceeded.
Preferred devices are recommended choices for future use
and best overall value.
©
Semiconductor Components Industries, LLC, 2005
1
Publication Order Number:
November, 2005 − Rev. 4
MCR12DSM/D