MCR12DCM, MCR12DCN
Preferred Device
Silicon Controlled Rectifiers
Reverse Blocking Thyristors
Designed for high volume, low cost, industrial and consumer
applications such as motor control; process control; temperature, light
and speed control.
http://onsemi.com
Features
SCRs
12 AMPERES RMS
600 − 800 VOLTS
• Small Size
• Passivated Die for Reliability and Uniformity
• Low Level Triggering and Holding Characteristics
• Epoxy Meets UL 94 V−0 @ 0.125 in
• ESD Ratings: Human Body Model, 3B u 8000 V
Machine Model, C u 400 V
G
A
K
• Pb−Free Packages are Available
4
MAXIMUM RATINGS (T = 25°C unless otherwise noted)
J
Rating
Symbol
Value
Unit
2
1
3
Peak Repetitive Off−State Voltage (Note 1)
V
DRM,
V
(T = −40 to 125°C, Sine Wave, 50 to 60 Hz,
V
RRM
J
Gate Open)
MCR12DCM
MCR12DCN
600
800
DPAK
CASE 369C
STYLE 4
On−State RMS Current
I
12
7.8
100
A
A
A
T(RMS)
(180° Conduction Angles; T = 90°C)
C
Average On−State Current
I
T(AV)
MARKING DIAGRAM
(180° Conduction Angles; T = 90°C)
C
Peak Non-Repetitive Surge Current
I
TSM
(1/2 Cycle, Sine Wave 60 Hz, T = 125°C)
J
YWW
R1
2
2
Circuit Fusing Consideration (t = 8.3 msec)
I t
41
A sec
2DCxG
Forward Peak Gate Power
P
5.0
W
W
A
GM
(Pulse Width ≤ 1.0 ꢀ sec, T = 90°C)
C
Forward Average Gate Power
P
G(AV)
0.5
2.0
Y
WW
= Year
= Work Week
R12DCx = Device Code
x= M or N
(t = 8.3 msec, T = 90°C)
C
Forward Peak Gate Current
I
GM
(Pulse Width ≤ 1.0 ꢀ sec, T = 90°C)
C
G
= Pb−Free Package
Operating Junction Temperature Range
Storage Temperature Range
T
−40 to 125
−40 to 150
°C
°C
J
T
stg
PIN ASSIGNMENT
Cathode
Maximum ratings are those values beyond which device damage can occur.
Maximum ratings applied to the device are individual stress limit values (not
normal operating conditions) and are not valid simultaneously. If these limits are
exceeded, device functional operation is not implied, damage may occur and
reliability may be affected.
1
2
3
4
Anode
Gate
1. V
for all types can be applied on a continuous basis. Ratings apply for zero
DRM
or negative gate voltage; positive gate voltage shall not be applied concurrent
with negative potential on the anode. Blocking voltages shall not be tested
with a constant current source such that the voltage ratings of the device are
exceeded.
Anode
ORDERING INFORMATION
See detailed ordering and shipping information in the package
dimensions section on page 2 of this data sheet.
Preferred devices are recommended choices for future use
and best overall value.
© Semiconductor Components Industries, LLC, 2006
1
Publication Order Number:
February, 2006 − Rev. 5
MCR12DCM/D