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MCR100-6U PDF预览

MCR100-6U

更新时间: 2024-11-25 14:53:07
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先科 - SWST 可控硅
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MCR100-6U 数据手册

 浏览型号MCR100-6U的Datasheet PDF文件第2页浏览型号MCR100-6U的Datasheet PDF文件第3页 
MCR100…U Series  
Sensitive Gate Silicon Controlled Rectifiers  
Reverse Blocking Thyristors  
Absolute Maximum Ratings (Ta = 25)  
Parameter  
Peak Repetitive Off-State Voltage 4)  
Symbol  
Value  
Unit  
V
(TJ = -40to 110, Sine Wave, 50 to 60 Hz, Gate Open)  
200  
400  
600  
V
DRM, VRRM  
MCR100-4U  
MCR100-6U  
MCR100-8U  
On-State RMS Current  
IT(RMS)  
ITSM  
0.8  
10  
A
A
(TC = 80 ) 180 onduction Angles  
Peak Non-Repetitive Surge Current  
(1/2 Cycle, Sine Wave, 60 Hz, TJ = 25)  
Circuit Fusing Considerations (t = 8.3 ms)  
Forward Peak Gate Power (Pulse Width 1 μs)  
Forward Average Gate Power (t = 8.3 ms)  
Peak Gate Current – Forward (Pulse Width 1 μs)  
Peak Gate Voltage – Reverse (Pulse Width 1 μs)  
Operating Junction Temperature Range  
I2t  
PGM  
PG(AV)  
IGM  
0.415  
A2s  
W
W
A
0.1  
0.1  
1
VGRM  
TJ  
5
V
- 40 to + 110  
- 40 to + 150  
Storage Temperature Range  
Characteristics at Ta = 25 ℃  
Parameter  
TStg  
Symbol  
Max.  
10  
Unit  
Peak Forward or Reverse Blocking Current 2)  
at VD = Rated VDRM and VRRM, RGK = 1 KΩ  
Peak Forward On-State Voltage 1)  
at ITM = 1 A Peak  
Gate Trigger Current 3)  
IDRM, IRRM  
VTM  
μA  
1.7  
V
IGT  
200  
μA  
at VAK = 7 V, RL = 100 Ω  
Holding Current 2)  
TC = 25℃  
at VAK = 7 V, Initiating Current = 20 mA  
5
10  
IH  
mA  
mA  
V
TC = - 40℃  
Latch Current  
at VAK = 7 V, Ig = 200 μA  
TC = 25℃  
TC = - 40℃  
10  
15  
IL  
Gate Trigger Voltage 3)  
at VAK = 7 V, RL = 100 Ω  
TC = 25℃  
TC = - 40℃  
0.8  
1.2  
VGT  
1) Indicates pulse teat width 1 ms, duty cycle 1%  
2)  
R
GK  
= 1 Kincluded in measurement  
3) Does not include RGK in measurement  
4)  
V
DRM  
and VRRM for all types can be applied on continous basis. Ratings apply for zero negative gate voltage; however,  
positive gate voltage shall not be applied concurrent with negative potential on the anode. Blocking voltages shall not be  
tested with a constant current sourse such that the voltage ratings of the devices are exceeded.  
®
Dated: 27/12/2013 Rev: 01  

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