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MC12080_06

更新时间： 2024-11-18 04:35:07
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安森美 - ONSEMI 预分频器
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4页 123K
描述
1.1 GHz Prescaler

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MC12080_06 数据手册

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MC12080  
1.1 GHz Prescaler  
Description  
The MC12080 is a single modulus divide by 10, 20, 40, 80 prescaler  
for low power frequency division of a 1.1 GHz high frequency input  
signal. Divide ratio control inputs SW1, SW2 and SW3 select the  
required divide ratio of ÷10, ÷20, ÷40, or ÷80.  
http://onsemi.com  
An external load resistor is required to terminate the output. An  
820 W resistor is recommended to achieve a 1.2 V output swing,  
MARKING  
DIAGRAM  
pp  
when dividing a 1.1 GHz input signal by the minimum divide by ratio  
of 10, assuming a 8.0 pF load. Output current can be minimized  
dependent on conditions such as output frequency, capacitive load  
being driven, and output voltage swing required. Typical values for  
8
SOIC−8  
D SUFFIX  
CASE 751  
12080  
ALYW  
G
8
load resistors are included in the V specification for various divide  
out  
1
ratios at 1.1 GHz input frequency.  
1
Features  
A
L
Y
W
G
= Assembly Location  
= Wafer Lot  
= Year  
= Work Week  
= Pb−Free Package  
• 1.1 GHz Toggle Frequency  
• Supply Voltage 4.5 to 5.5 V  
• Low Power 3.7 mA Typical at V = 5.0 V  
• Operating Temperature Range of −40 to 85°C  
• Pb−Free Packages are Available  
CC  
PIN CONNECTIONS  
Table 1. FUNCTIONAL TABLE  
1
2
3
4
8
7
6
5
In  
In  
SW1  
L
SW2  
L
SW3  
L
Divide Ratio  
V
SW3  
SW2  
GND  
CC  
80  
40  
40  
20  
40  
20  
20  
10  
SW1  
Out  
L
L
H
L
H
L
(Top View)  
L
H
H
H
L
L
ORDERING INFORMATION  
See detailed ordering and shipping information in the package  
dimensions section on page 3 of this data sheet.  
H
L
H
H
H
L
H
H
H
NOTE: SW1, SW2 and SW3: H = V , L = Open.  
CC  
Table 2. MAXIMUM RATINGS  
Rating  
Symbol  
Value  
Unit  
Vdc  
°C  
Power Supply Voltage, Pin 2  
Operating Temperature Range  
Storage Temperature Range  
Maximum Output Current, Pin 4  
V
−0.5 to 7.0  
−40 to 85  
−65 to 150  
10  
CC  
T
A
T
stg  
°C  
I
mA  
O
Maximum ratings are those values beyond which device damage can occur.  
Maximum ratings applied to the device are individual stress limit values (not  
normal operating conditions) and are not valid simultaneously. If these limits are  
exceeded, device functional operation is not implied, damage may occur and  
reliability may be affected.  
NOTE: ESD data available upon request.  
©
Semiconductor Components Industries, LLC, 2006  
1
Publication Order Number:  
January, 2006 − Rev. 6  
MC12080/D  
1234

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