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M29W256GL PDF预览

M29W256GL

更新时间: 2024-02-23 12:01:04
品牌 Logo 应用领域
镁光 - MICRON 闪存存储
页数 文件大小 规格书
89页 1158K
描述
Parallel NOR Flash Embedded Memory

M29W256GL 数据手册

 浏览型号M29W256GL的Datasheet PDF文件第2页浏览型号M29W256GL的Datasheet PDF文件第3页浏览型号M29W256GL的Datasheet PDF文件第4页浏览型号M29W256GL的Datasheet PDF文件第5页浏览型号M29W256GL的Datasheet PDF文件第6页浏览型号M29W256GL的Datasheet PDF文件第7页 
256Mb: 3V Embedded Parallel NOR Flash  
Features  
Parallel NOR Flash Embedded Memory  
M29W256GH, M29W256GL  
• VPP/WP# pin protection  
– Protects first or last block regardless of block  
Features  
• Supply voltage  
protection settings  
– VCC = 2.7–3.6V (program, erase, read)  
– VCCQ = 1.65–3.6V (I/O buffers)  
– VPPH = 12V for fast program (optional)  
• Asynchronous random/page read  
– Page size: 8words or 16 bytes  
– Page access: 25, 30ns  
• Software protection  
– Volatile protection  
– Nonvolatile protection  
– Password protection  
• Extended memory block  
– 128-word (256-byte) memory block for perma-  
nent, secure identification  
– Programmed or locked at the factory or by the  
customer  
• Common flash interface  
– 64-bit security code  
• Low power consumption: Standby and automatic  
mode  
• JESD47H-compliant  
– 100,000 minimum PROGRAM/ERASE cycles per  
block  
– Data retention: 20 years (TYP)  
• 65nm single-level cell (SLC) process technology  
• Fortified BGA, TBGA, and TSOP packages  
• Green packages available  
– RoHS-compliant  
– Halogen-free  
– Random access: 60ns1, 70, 80ns  
• Fast program commands: 32-word (64-byte) write  
buffer  
• Enhanced buffered program commands: 256-word  
• Program time  
– 16µs per byte/word TYP  
– Chip program time: 10s with VPPH and 16s with-  
out VPPH  
• Memory organization  
– Uniform blocks: 256 main blocks, 128-Kbytes or  
64-Kwords each  
• Program/erase controller  
– Embedded byte/word program algorithms  
• Program/erase suspend and resume capability  
– Read from any block during a PROGRAM SUS-  
PEND operation  
– Read or program another block during an ERASE  
SUSPEND operation  
• Automotive device grade (6): temperature –40°C to  
+85°C (automotive grade certified)  
• Automotive device grade (3): temperature –40°C to  
+125°C (automotive grade certified)  
• Unlock bypass, block erase, chip erase, write to buf-  
fer and program  
– Fast buffered/batch programming  
– Fast block/chip erase  
1. The 60ns device is available upon customer  
request.  
Note:  
PDF: 09005aef84bd3b68  
m29w_256mb.pdf - Rev. B 5/13 EN  
Micron Technology, Inc. reserves the right to change products or specifications without notice.  
1
© 2013 Micron Technology, Inc. All rights reserved.  
Products and specifications discussed herein are subject to change by Micron without notice.  

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