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LP5952TL-2.0/NOPB PDF预览

LP5952TL-2.0/NOPB

更新时间: 2024-11-26 14:52:43
品牌 Logo 应用领域
德州仪器 - TI 输出元件调节器
页数 文件大小 规格书
24页 1234K
描述
350mA Dual Rail Linear Regulator 5-DSBGA -40 to 125

LP5952TL-2.0/NOPB 技术参数

是否无铅: 含铅是否Rohs认证: 符合
生命周期:Obsolete零件包装代码:BGA
包装说明:VFBGA, BGA5,3X3,17/10针数:5
Reach Compliance Code:compliantECCN代码:EAR99
HTS代码:8542.39.00.01Factory Lead Time:1 week
风险等级:5.65可调性:FIXED
标称回动电压 1:0.088 V最大绝对输入电压:6 V
最大输入电压:4.5 V最小输入电压:0.7 V
JESD-30 代码:R-PBGA-B5JESD-609代码:e1
长度:1.326 mm最大电网调整率:0.0044%
最大负载调整率:0.021%湿度敏感等级:1
功能数量:1输出次数:1
端子数量:5工作温度TJ-Max:125 °C
工作温度TJ-Min:-40 °C最大输出电流 1:0.35 A
最大输出电压 1:2.04 V最小输出电压 1:1.96 V
标称输出电压 1:2 V封装主体材料:PLASTIC/EPOXY
封装代码:VFBGA封装等效代码:BGA5,3X3,17/10
封装形状:RECTANGULAR封装形式:GRID ARRAY, VERY THIN PROFILE, FINE PITCH
包装方法:TAPE AND REEL峰值回流温度(摄氏度):260
认证状态:Not Qualified调节器类型:FIXED POSITIVE SINGLE OUTPUT STANDARD REGULATOR
座面最大高度:0.675 mm子类别:Other Regulators
表面贴装:YES技术:CMOS
端子面层:Tin/Silver/Copper (Sn/Ag/Cu)端子形式:BALL
端子节距:0.5 mm端子位置:BOTTOM
处于峰值回流温度下的最长时间:NOT SPECIFIED最大电压容差:2%
宽度:0.96 mmBase Number Matches:1

LP5952TL-2.0/NOPB 数据手册

 浏览型号LP5952TL-2.0/NOPB的Datasheet PDF文件第2页浏览型号LP5952TL-2.0/NOPB的Datasheet PDF文件第3页浏览型号LP5952TL-2.0/NOPB的Datasheet PDF文件第4页浏览型号LP5952TL-2.0/NOPB的Datasheet PDF文件第5页浏览型号LP5952TL-2.0/NOPB的Datasheet PDF文件第6页浏览型号LP5952TL-2.0/NOPB的Datasheet PDF文件第7页 
LP5952  
www.ti.com  
SNVS469E OCTOBER 2006REVISED MAY 2013  
350mA Dual Rail Linear Regulator  
Check for Samples: LP5952  
1
FEATURES  
APPLICATIONS  
2
Excellent load transient response: ±15mV  
typical  
Mobile Phones  
Hand-Held Radios  
Excellent line transient response: ±1mV typical  
0.7V VIN 4.5V  
Personal Digital Assistants  
Palm-Top PCs  
2.5V VBATT 5.5V  
Portable Instruments  
Battery Powered Devices  
0.5V VOUT 2.0V  
For ILOAD = 350mA:  
DESCRIPTION  
The LP5952 is a Dual Supply Rail Linear Regulator  
optimized for powering ultra-low voltage circuits from  
a single Li-Ion cell or 3 cell NiMH/NiCd batteries.  
V
BATT VOUT(NOM) + 1.5V or 2.5V whichever  
is higher  
For ILOAD = 150mA:  
BATT VOUT(NOM) + 1.3V or 2.5V whichever  
is higher  
V
In the typical post regulation application VBATT is  
directly connected to the battery (range 2.5V...5.5V)  
and VIN is supplied by the output voltage of the DC-  
DC Converter (range 0.7V...4.5V).  
50µA typical quiescent current from VBATT  
10µA typical quiescent current from VIN  
0.1µA typical quiescent current in shutdown  
Ensured 350mA output current  
The device offers superior dropout and transient  
features combined with very low quiescent currents.  
In shutdown mode (Enable pin pulled low) the device  
turns off and reduces battery consumption to 0.1µA  
(typ.).  
Noise voltage = 100µVRMS typical  
Operates from a single Li-Ion cell or 3 cell  
NiMH/NiCd batteries  
The LP5952 also features internal protection against  
over-temperature, over-current and under-voltage  
conditions.  
Only one or two tiny surface-mount external  
components required depending on  
application  
Performance is specified for a -40°C to 125°C  
junction temperature range.  
Small, thin 5-bump DSBGA package and 6-pin  
Chip On Lead USON package, lead free  
Thermal-overload and short-circuit protection  
-40°C to +125°C junction temperature range  
Typical Application Circuit  
V
V
BATT  
1.5V  
A
3
OUT  
C1  
LP5952  
V
OUTDCDC  
2.2 mF  
V
BATT  
3.0V to 5.5V  
V
IN  
1.8V  
V
SW  
L1: 2.2 mH  
Load  
0...350 mA  
IN  
A
1
A
1
B2  
LM3671  
TL-1.8  
4.7 mF  
10 mF  
GND  
EN  
A
3
EN  
GND  
C3  
B2  
FB  
C3  
C1  
Figure 1. Typical Application Circuit with DC-DC Converter as Pre-Regulator for VIN  
1
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of  
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.  
All trademarks are the property of their respective owners.  
2
PRODUCTION DATA information is current as of publication date.  
Products conform to specifications per the terms of the Texas  
Instruments standard warranty. Production processing does not  
necessarily include testing of all parameters.  
Copyright © 2006–2013, Texas Instruments Incorporated  
 

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