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LOG101AIDR

更新时间： 2024-11-26 22:28:07

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描述
Precision LOGARITHMIC AND LOG RATIO AMPLIFIER

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LOG101AIDR 数据手册

LOG101

SBOS242B – MAY 2002 – REVISED JUNE 2004

Precision

LOGARITHMIC AND LOG RATIO AMPLIFIER

DESCRIPTION

FEATURES

The LOG101 is a versatile integrated circuit that computes

the logarithm or log ratio of an input current relative to a

reference current.

●

EASY-TO-USE COMPLETE CORE FUNCTION

● HIGH ACCURACY: 0.01% FSO Over 5 Decades

● WIDE INPUT DYNAMIC RANGE:

The LOG101 is tested over a wide dynamic range of input

signals. In log ratio applications, a signal current can come

from a photodiode, and a reference current from a resistor in

series with a precision external reference.

7.5 Decades, 100pA to 3.5mA

● LOW QUIESCENT CURRENT: 1mA

● WIDE SUPPLY RANGE: ±4.5V to ±18V

The output signal at V_OUTis trimmed to 1V per decade of input

current allowing seven decades of input current dynamic

range.

APPLICATIONS

● LOG, LOG RATIO COMPUTATION:

Communication, Analytical, Medical, Industrial,

Test, and General Instrumentation

Low DC offset voltage and temperature drift allow accurate

measurement of low-level signals over a wide environmental

temperature range. The LOG101 is specified over the tem-

perature range –5°C to +75°C, with operation over

–40°C to +85°C.

● PHOTODIODE SIGNAL COMPRESSION AMPS

● ANALOG SIGNAL COMPRESSION IN FRONT

Note: Protected under US Patent #6,667,650; other patents pending.

OF ANALOG-TO-DIGITAL (A/D) CONVERTERS

I₂

C_C

V_OUT= (1V) • LOG (I₁/I₂)

V+

I₁

LOG101

Q₁

Q₂

A₂

A₁

V_OUT

R₂

R₁

GND

V–

Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of

Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.

All trademarks are the property of their respective owners.

PRODUCTION DATA information is current as of publication date.

Products conform to specifications per the terms of Texas Instruments

standard warranty. Production processing does not necessarily include

testing of all parameters.

www.ti.com

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