LMV1012
www.ti.com
SNAS194H –NOVEMBER 2002–REVISED MAY 2013
LMV1012 Analog Series: Pre-Amplified IC's for High Gain 2-Wire Microphones
Check for Samples: LMV1012
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FEATURES
DESCRIPTION
The LMV1012 is an audio amplifier series for small
form factor electret microphones. This 2-wire portfolio
is designed to replace the JFET amplifier currently
being used. The LMV1012 series is ideally suited for
applications requiring high signal integrity in the
presence of ambient or RF noise, such as in cellular
communications. The LMV1012 audio amplifiers are
specified to operate over a 2.2V to 5.0V supply
voltage range with fixed gains of 7.8 dB, 15.6 dB,
20.9 dB, and 23.8 dB. The devices offer excellent
THD, gain accuracy and temperature stability as
compared to a JFET microphone.
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Typical LMV1012-15, 2.2V Supply, RL = 2.2 kΩ,
C = 2.2 μF, VIN = 18 mVPP, Unless Otherwise
Specified
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Supply Voltage: 2V - 5V
Supply Current: <180 μA
Signal to Noise Ratio (A-Weighted): 60 dB
Output Voltage Noise (A-Weighted): −89 dBV
Total Harmonic Distortion: 0.09%
Voltage Gain
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LMV1012-07: 7.8 dB
LMV1012-15: 15.6 dB
LMV1012-20: 20.9 dB
LMV1012-25: 23.8 dB
The LMV1012 series enables a two-pin electret
microphone solution, which provides direct pin-to-pin
compatibility with the existing JFET market.
The devices are offered in extremely thin space
saving 4-bump DSBGA packages. The LMV1012XP
is designed for 1.0 mm canisters and thicker ECM
canisters. These extremely miniature packages are
designed for electret condenser microphones (ECM)
form factor.
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Temperature Range: −40°C to 85°C
Offered in 4-Bump DSBGA Packages
APPLICATIONS
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Cellular Phones
Headsets
Mobile Communications
Automotive Accessories
PDAs
Accessory Microphone Products
Schematic Diagram
Built-In Gain Electret Microphone
DIAPHRAGM
V
DD
2.2k
AIRGAP
ELECTRET
2.2mF
BACKPLATE
CONNECTOR
OUTPUT
LMV1012
IC
-
INPUT
+
-
+
GND
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PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of the Texas
Instruments standard warranty. Production processing does not
necessarily include testing of all parameters.
Copyright © 2002–2013, Texas Instruments Incorporated