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LMP2012 MDR PDF预览

LMP2012 MDR

更新时间: 2024-11-23 11:11:51
品牌 Logo 应用领域
德州仪器 - TI 放大器运算放大器
页数 文件大小 规格书
13页 187K
描述
双路、高精度、轨到轨输出运算放大器 | Y | 0 | -55 to 125

LMP2012 MDR 数据手册

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LMP2012QML  
www.ti.com  
SNOSAU5H MARCH 2007REVISED APRIL 2013  
LMP2012QML Dual High Precision, Rail-to-Rail Output Operational Amplifier  
1
FEATURES  
DESCRIPTION  
The LMP2012 offers unprecedented accuracy and  
stability. This device utilizes patented techniques to  
measure and continually correct the input offset error  
voltage. The result is an amplifier which is ultra stable  
over time and temperature. It has excellent CMRR  
and PSRR ratings, and does not exhibit the familiar  
1/f voltage and current noise increase that plagues  
traditional amplifiers. The combination of the  
LMP2012 characteristics makes it a good choice for  
transducer amplifiers, high gain configurations, ADC  
buffer amplifiers, DAC I-V conversion, and any other  
2.7V-5V application requiring precision and long term  
stability.  
2
Total Ionizing Dose 50 krad(Si)  
ELDRS Free 50 krad(Si)  
TCVIO Temperature Sensitivity (Typical) 0.015  
µV/°C  
(For VS = 5V, Typical Unless Otherwise Noted)  
Low Ensured VIO over Temperature 60 µV  
Low Noise with no 1/f 35nV/Hz  
High CMRR 90 dB  
High PSRR 90 dB  
High AVOL 85 dB  
Wide Gain-Bandwidth Product 3MHz  
High Slew Rate 4V/µs  
Other useful benefits of the LMP2012 are rail-rail  
output, low supply current of 930 μA, and wide gain-  
bandwidth product of 3 MHz. These extremely  
versatile features found in the LMP2012 provide high  
performance and ease of use.  
Rail-to-Rail Output 30mV  
No External Capacitors Required  
The QMLV version of the LMP2012 has been rated to  
tolerate a total dose level of 50krad/(Si) radiation by  
test method 1019 of MIL-STD-883.  
APPLICATIONS  
Attitude and Orbital Controls  
Static Earth Sensing  
Sun Sensors  
Inertial Sensors  
Pressure Sensors  
Gyroscopes  
Earth Observation Systems  
Connection Diagram  
OUT A  
IN A-  
IN A+  
V-  
1
2
3
4
5
10  
9
V+  
OUT B  
IN B-  
8
IN B+  
7
N/C  
6
N/C  
Figure 1. 10-Lead CLGA (Top View)  
See NAC Package  
These devices have limited built-in ESD protection. The leads should be shorted together or the device placed in conductive foam  
during storage or handling to prevent electrostatic damage to the MOS gates.  
1
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of  
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.  
All trademarks are the property of their respective owners.  
2
PRODUCTION DATA information is current as of publication date.  
Products conform to specifications per the terms of the Texas  
Instruments standard warranty. Production processing does not  
necessarily include testing of all parameters.  
Copyright © 2007–2013, Texas Instruments Incorporated  

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