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LMH6624WG-QMLV PDF预览

LMH6624WG-QMLV

更新时间: 2024-11-23 05:42:23
品牌 Logo 应用领域
美国国家半导体 - NSC 运算放大器
页数 文件大小 规格书
12页 180K
描述
ULTRA LOW NOISE WIDEBAND OP AMP

LMH6624WG-QMLV 技术参数

生命周期:Transferred零件包装代码:SOIC
包装说明:SOP, SOP10,.45针数:10
Reach Compliance Code:unknownECCN代码:EAR99
HTS代码:8542.33.00.01风险等级:5.51
放大器类型:OPERATIONAL AMPLIFIER架构:VOLTAGE-FEEDBACK
最大平均偏置电流 (IIB):20 µA频率补偿:YES
最大输入失调电压:1000 µVJESD-30 代码:R-GDSO-G10
低-失调:YES负供电电压上限:-6 V
标称负供电电压 (Vsup):-5 V功能数量:1
端子数量:10最高工作温度:125 °C
最低工作温度:-55 °C封装主体材料:CERAMIC, GLASS-SEALED
封装代码:SOP封装等效代码:SOP10,.45
封装形状:RECTANGULAR封装形式:SMALL OUTLINE
电源:+-2.5/+-6/+5/+12 V认证状态:Not Qualified
筛选级别:MIL-PRF-38535 Class V座面最大高度:2.33 mm
子类别:Operational Amplifier最大压摆率:18 mA
供电电压上限:6 V标称供电电压 (Vsup):5 V
表面贴装:YES技术:BIPOLAR
温度等级:MILITARY端子形式:GULL WING
端子节距:1.27 mm端子位置:DUAL
最小电压增益:3980宽带:YES
宽度:6.12 mmBase Number Matches:1

LMH6624WG-QMLV 数据手册

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MICROCIRCUIT DATA SHEET  
Original Creation Date: 07/28/03  
Last Update Date: 08/20/03  
MNLMH6624-X REV 1A0  
Last Major Revision Date: 08/19/03  
ULTRA LOW NOISE WIDEBAND OP AMP  
General Description  
The LMH6624 combines a wide bandwidth (1.5GHz GBW) with very low input noise  
(092nV/SqRtHz, 2.3pA/SqRtHz) and ultra low dc errors (100uV Vos, +0.1uV/ C drift) to  
provide a very precise operational amplifier with wide dynamic-range. This enables the  
user to achieve closed-loop gains of greater than 10.  
The LMH6624's traditional voltage feedback topology provides the following benefits:  
balanced inputs, low offsets voltage and offset current, very low offset drift, 81dB  
open-loop gain, 95dB common mode rejection ratio, and 88dB power supply rejection ratio.  
The LMH6624 operates from +2.5V to +6V in dual supply mode and from +5V to +12V in single  
supply configuration. The LMH6624 is stable for closed-loop gain of Av < -10 or +10 <AV.  
LMH6624 is offered in SQT23-5 and SIOC-8 packages.  
Industry Part Number  
NS Part Numbers  
LMH6624  
LMH6624J-QML  
LMH6624J-QMLV  
LMH6624WG-QML  
LMH6624WG-QMLV  
Prime Die  
LMH6624A  
Controlling Document  
SEE FEATURES SECTION  
Processing  
Subgrp Description  
Temp (oC)  
MIL-STD-883, Method 5004  
1
Static tests at  
+25  
2
Static tests at  
+125  
-55  
3
Static tests at  
4
Dynamic tests at  
Dynamic tests at  
Dynamic tests at  
Functional tests at  
Functional tests at  
Functional tests at  
Switching tests at  
Switching tests at  
Switching tests at  
+25  
Quality Conformance Inspection  
5
+125  
-55  
6
MIL-STD-883, Method 5005  
7
+25  
8A  
8B  
9
+125  
-55  
+25  
10  
11  
+125  
-55  
1

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