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LM9076Q-Q1 PDF预览

LM9076Q-Q1

更新时间: 2024-11-24 00:59:43
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德州仪器 - TI /
页数 文件大小 规格书
20页 1173K
描述
150mA Ultra-Low Quiescent Current LDO Regulator with Delayed Reset Output

LM9076Q-Q1 数据手册

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LM9076Q  
www.ti.com  
SNVS713B APRIL 2011REVISED MARCH 2013  
LM9076Q 150mA Ultra-Low Quiescent Current LDO Regulator with Delayed Reset Output  
Check for Samples: LM9076Q  
1
FEATURES  
DESCRIPTION  
The LM9076Q is a ±3%, 150 mA logic controlled  
voltage regulator. The regulator features an active  
low delayed reset output flag which can be used to  
reset a microprocessor system at turn-ON and in the  
event that the regulator output voltage falls below a  
minimum value. An external capacitor programs a  
delay time interval before the reset output pin can  
return high.  
2
AEC-Q100 Grade1 Qualified (-40°C to +125°C)  
Available with 5.0V or 3.3V Output Voltage  
Ultra Low Ground Pin Current, 25 μA Typical  
for 100 μA Load  
VOUT Initial Accuracy of ±1.5%  
VOUT Accurate to ±3% Over Load and  
Temperature Conditions  
Designed for automotive and industrial applications,  
the LM9076Q contains a variety of protection features  
such as thermal shutdown, input transient protection  
Low Dropout Voltage, 200 mV Typical with  
150 mA Load  
Low Off State Ground Pin Current for  
LM9076QBMA  
and  
a wide operating temperature range. The  
LM9076Q uses an PNP pass transistor which allows  
low drop-out voltage operation.  
Delayed RESET Output Pin for Low VOUT  
Detection  
+70V/-50V Voltage Transients  
Operational VIN up to +40V  
1
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of  
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.  
2
All trademarks are the property of their respective owners.  
PRODUCTION DATA information is current as of publication date.  
Products conform to specifications per the terms of the Texas  
Instruments standard warranty. Production processing does not  
necessarily include testing of all parameters.  
Copyright © 2011–2013, Texas Instruments Incorporated  

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