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LM193A

更新时间: 2024-11-08 22:51:55
品牌 Logo 应用领域
美国国家半导体 - NSC 比较器
页数 文件大小 规格书
12页 176K
描述
LOW POWER LOW OFFSET VOLTAGE DUAL COMPARATORS

LM193A 数据手册

 浏览型号LM193A的Datasheet PDF文件第2页浏览型号LM193A的Datasheet PDF文件第3页浏览型号LM193A的Datasheet PDF文件第4页浏览型号LM193A的Datasheet PDF文件第5页浏览型号LM193A的Datasheet PDF文件第6页浏览型号LM193A的Datasheet PDF文件第7页 
MICROCIRCUIT DATA SHEET  
Original Creation Date: 05/18/95  
Last Update Date: 06/14/04  
MNLM193A-X REV 1B3  
Last Major Revision Date: 09/02/97  
LOW POWER LOW OFFSET VOLTAGE DUAL COMPARATORS  
General Description  
The LM193A consists of two independent precision voltage comparators with an offset  
voltage specification as low as 2.0mV max for two comparators which were designed  
specifically to operate from a single power supply over a wide range of voltages.  
Operation from split power supplies is also possible and the low power supply current  
drain is independent of the magniture of the power supply voltage. These comparators also  
have a unique characteristic in that the input common-mode voltage range includes ground,  
even though operated from a single power supply voltage.  
Application areas include limit comparators, simple analog to digital converters; pulse,  
squarewave and time delay generators; wide range VCO; MOS clock timers; multivibrators and  
high voltage digital logic gates. The LM193A was designed to directly interface with TTL  
and CMOS. When operated from both plus and minus power supplies, the LM193A will directly  
interface with MOS logic where their low power drain is a distinct advantage over standard  
comparators.  
Industry Part Number  
NS Part Numbers  
LM193A  
LM193AH-QMLV  
LM193AH/883  
LM193AJ-QMLV  
LM193AJ/883  
Prime Die  
LM193A  
Controlling Document  
See Features Page  
Processing  
Subgrp Description  
Temp (oC)  
MIL-STD-883, Method 5004  
1
Static tests at  
+25  
2
Static tests at  
+125  
-55  
3
Static tests at  
4
Dynamic tests at  
Dynamic tests at  
Dynamic tests at  
Functional tests at  
Functional tests at  
Functional tests at  
Switching tests at  
Switching tests at  
Switching tests at  
+25  
Quality Conformance Inspection  
5
+125  
-55  
6
MIL-STD-883, Method 5005  
7
+25  
8A  
8B  
9
+125  
-55  
+25  
10  
11  
+125  
-55  
1

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