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K9K1208U0M-YCB0 PDF预览

K9K1208U0M-YCB0

更新时间: 2024-11-29 22:09:59
品牌 Logo 应用领域
三星 - SAMSUNG 闪存内存集成电路光电二极管
页数 文件大小 规格书
26页 353K
描述
64M x 8 Bit NAND Flash Memory

K9K1208U0M-YCB0 技术参数

是否Rohs认证: 不符合生命周期:Obsolete
零件包装代码:TSOP1包装说明:TSOP1, TSSOP48,.8,20
针数:48Reach Compliance Code:compliant
ECCN代码:3A991.B.1.AHTS代码:8542.32.00.51
风险等级:5.87Is Samacsys:N
最长访问时间:35 ns命令用户界面:YES
数据轮询:NOJESD-30 代码:R-PDSO-G48
JESD-609代码:e0长度:18.4 mm
内存密度:536870912 bit内存集成电路类型:FLASH
内存宽度:8功能数量:1
部门数/规模:4K端子数量:48
字数:67108864 words字数代码:64000000
工作模式:ASYNCHRONOUS最高工作温度:70 °C
最低工作温度:组织:64MX8
封装主体材料:PLASTIC/EPOXY封装代码:TSOP1
封装等效代码:TSSOP48,.8,20封装形状:RECTANGULAR
封装形式:SMALL OUTLINE, THIN PROFILE页面大小:512 words
并行/串行:PARALLEL电源:3.3 V
编程电压:2.7 V认证状态:Not Qualified
就绪/忙碌:YES座面最大高度:1.2 mm
部门规模:16K最大待机电流:0.00005 A
子类别:Flash Memories最大压摆率:0.025 mA
最大供电电压 (Vsup):3.6 V最小供电电压 (Vsup):2.7 V
标称供电电压 (Vsup):3.3 V表面贴装:YES
技术:CMOS温度等级:COMMERCIAL
端子面层:Tin/Lead (Sn/Pb)端子形式:GULL WING
端子节距:0.5 mm端子位置:DUAL
切换位:NO类型:NAND TYPE
宽度:12 mmBase Number Matches:1

K9K1208U0M-YCB0 数据手册

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K9K1208U0M-YCB0, K9K1208U0M-YIB0  
FLASH MEMORY  
Document Title  
64M x 8 Bit NAND Flash Memory  
Revision History  
Revision No History  
Draft Date  
Remark  
0.0  
1. Initial issue  
June 19th 2000 Preliminary  
- The followings are disprepancy items between K9K5608U0M (256Mb  
DDP) and K9K1208U0M (512Mb DDP).  
AC Characteristics  
Read Cycle Time (tRC)  
Write Cycle Time (tWC)  
WE High hold Time (tWH)  
Data Hold Time (tDH)  
K9K5608U0M  
Min. 50ns  
Min. 50ns  
Min. 15ns  
Min. 10ns  
Min. 15ns  
K9K1208U0M  
Min. 60ns  
Min. 60ns  
Min. 25ns  
Min. 15ns  
Min. 25ns  
RE High Hold Time (tREH)  
June 24th 2000 Preliminary  
July 17th 2000 Final  
Nov. 20th 2000  
1. Changed Input / Output Capacitance  
- Input / Output Capacitance (Max.) : 20 pF --> 30pF  
- Input Capacitance (Max.) : 20 pF --> 30pF  
0.1  
1. Changed SE pin description  
- SE is recommended to coupled to GND or Vcc and should not be  
toggled during reading or programming.  
0.2  
0.3  
1. Changed don’t care mode in address cycles  
- *X can be "High" or "Low" => *L must be set to "Low"  
2. Explain how pointer operation works in detail.  
3. Renamed GND input (pin # 6) on behalf of SE (pin # 6)  
- The SE input controls the access of the spare area. When SE is high,  
the spare area is not accessible for reading or programming. SE is rec  
ommended to be coupled to GND or Vcc and should not be toggled  
during reading or programming.  
=> Connect this input pin to GND or set to static low state unless the  
sequential read mode excluding spare area is used.  
4. Updated operation for tRST timing  
- If reset command(FFh) is written at Ready state, the device goes into  
Busy for maximum 5us.  
Note : For more detailed features and specifications including FAQ, please refer to Samsung’s Flash web site.  
http://www.intl.samsungsemi.com/Memory/Flash/datasheets.html  
The attached data sheets are prepared and approved by SAMSUNG Electronics. SAMSUNG Electronics CO., LTD. reserve the  
right to change the specifications. SAMSUNG Electronics will evaluate and reply to your requests and questions about device. If you  
have any questions, please contact the SAMSUNG branch office near your office.  
1

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