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K9F6408U0B-TIB0 PDF预览

K9F6408U0B-TIB0

更新时间: 2024-01-16 00:26:08
品牌 Logo 应用领域
三星 - SAMSUNG 闪存存储内存集成电路光电二极管
页数 文件大小 规格书
27页 414K
描述
8M x 8 Bit NAND Flash Memory

K9F6408U0B-TIB0 技术参数

是否Rohs认证: 不符合生命周期:Obsolete
零件包装代码:TSOP2包装说明:TSOP2, TSOP40/44,.46,32
针数:44Reach Compliance Code:compliant
ECCN代码:3A991.B.1.AHTS代码:8542.32.00.51
风险等级:5.75最长访问时间:35 ns
命令用户界面:YES数据轮询:NO
JESD-30 代码:R-PDSO-G40JESD-609代码:e0
长度:18.41 mm内存密度:67108864 bit
内存集成电路类型:FLASH内存宽度:8
功能数量:1部门数/规模:1K
端子数量:40字数:8388608 words
字数代码:8000000工作模式:ASYNCHRONOUS
最高工作温度:85 °C最低工作温度:-40 °C
组织:8MX8封装主体材料:PLASTIC/EPOXY
封装代码:TSOP2封装等效代码:TSOP40/44,.46,32
封装形状:RECTANGULAR封装形式:SMALL OUTLINE, THIN PROFILE
页面大小:512 words并行/串行:PARALLEL
峰值回流温度(摄氏度):NOT SPECIFIED电源:3.3 V
编程电压:2.7 V认证状态:Not Qualified
就绪/忙碌:YES座面最大高度:1.2 mm
部门规模:8K最大待机电流:0.00005 A
子类别:Flash Memories最大压摆率:0.02 mA
最大供电电压 (Vsup):3.6 V最小供电电压 (Vsup):2.7 V
标称供电电压 (Vsup):3.3 V表面贴装:YES
技术:CMOS温度等级:INDUSTRIAL
端子面层:Tin/Lead (Sn/Pb)端子形式:GULL WING
端子节距:0.8 mm端子位置:DUAL
处于峰值回流温度下的最长时间:NOT SPECIFIED切换位:NO
类型:NAND TYPE宽度:10.16 mm
Base Number Matches:1

K9F6408U0B-TIB0 数据手册

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K9F6408U0B-TCB0, K9F6408U0B-TIB0  
FLASH MEMORY  
Document Title  
8M x 8 Bit NAND Flash Memory  
Revision History  
Revision No. History  
Draft Date  
Remark  
0.0  
0.1  
Initial issue.  
July 17th 2000  
Preliminary  
1. Changed endurance : 1 million -> 100K program/erase cycles  
1. Changed don’t care mode in address cycles  
Nov. 20th 2000  
- *X can be "High" or "Low" => *L must be set to "Low"  
2. Explain how pointer operation works in detail.  
3. Renamed GND input (pin # 6) on behalf of SE (pin # 6)  
- The SE input controls the access of the spare area. When SE is high,  
the spare area is not accessible for reading or programming. SE is rec  
ommended to be coupled to GND or Vcc and should not be toggled  
during reading or programming.  
=> Connect this input pin to GND or set to static low state unless the  
sequential read mode excluding spare area is used.  
4. Updated operation for tRST timing  
- If reset command(FFh) is written at Ready state, the device goes into  
Busy for maximum 5us.  
0.2  
1.Powerup sequence is added  
: Recovery time of minimum 1ms is required before internal circuit gets  
ready for any command sequences  
Jul. 25th. 2001  
~ 2.5V  
~ 2.5V  
V
CC  
High  
WP  
WE  
1m  
2. AC parameter tCLR(CLE to RE Delay, min 50ns) is added.  
3. AC parameter tAR1 value : 100ns --> 20ns  
Note : For more detailed features and specifications including FAQ, please refer to Samsung’s Flash web site.  
http://www.intl.samsungsemi.com/Memory/Flash/datasheets.html  
The attached datasheets are prepared and approved by SAMSUNG Electronics. SAMSUNG Electronics CO., LTD. reserve the right to change the  
specifications. SAMSUNG Electronics will evaluate and reply to your requests and questions about device. If you have any questions, please contact the  
SAMSUNG branch office near you.  
1

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