SN54HCT04, SN74HCT04
HEX INVERTERS
SCLS042D – JULY 1986 – REVISED JULY 2003
Operating Voltage Range of 4.5 V to 5.5 V
Outputs Can Drive Up To 10 LSTTL Loads
Typical t = 13 ns
pd
±4-mA Output Drive at 5 V
Low Power Consumption, 20-µA Max I
Low Input Current of 1 µA Max
CC
Inputs Are TTL-Voltage Compatible
SN54HCT04 . . . J PACKAGE
SN74HCT04 . . . D, N, NS, OR PW PACKAGE
(TOP VIEW)
SN54HCT04 . . . FK PACKAGE
(TOP VIEW)
14
13
12
11
10
9
1A
1Y
V
CC
1
2
3
4
5
6
7
3
2
1
20 19
18
6A
6Y
5A
5Y
4A
4Y
6Y
NC
5A
2A
NC
2Y
4
5
6
7
8
2A
17
16
2Y
3A
15 NC
14
9 10 11 12 13
NC
3A
3Y
5Y
8
GND
NC – No internal connection
description/ordering information
These devices contain six independent inverters. They perform the Boolean function Y = A in positive logic.
ORDERING INFORMATION
ORDERABLE
PART NUMBER
TOP-SIDE
MARKING
†
PACKAGE
T
A
PDIP – N
Tube of 25
Tube of 50
Reel of 2500
Reel of 250
Reel of 2000
Tube of 90
Reel of 2000
Reel of 250
Tube of 25
Tube of 55
SN74HCT04N
SN74HCT04N
SN74HCT04D
SOIC – D
SN74HCT04DR
SN74HCT04DT
SN74HCT04NSR
SN74HCT04PW
SN74HCT04PWR
SN74HCT04PWT
SNJ54HCT04J
SNJ54HCT04FK
HCT04
–40°C to 85°C
SOP – NS
TSSOP – PW
HCT04
HT04
CDIP – J
SNJ54HCT04J
–55°C to 125°C
LCCC – FK
SNJ54HCT04FK
†
Package drawings, standard packing quantities, thermal data, symbolization, and PCB design guidelines are
available at www.ti.com/sc/package.
FUNCTION TABLE
(each inverter)
INPUT
A
OUTPUT
Y
H
L
L
H
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
Copyright 2003, Texas Instruments Incorporated
On products compliant to MIL-PRF-38535, all parameters are tested
unless otherwise noted. On all other products, production
processing does not necessarily include testing of all parameters.
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of Texas Instruments
standard warranty. Production processing does not necessarily include
testing of all parameters.
1
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