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JL139BDA PDF预览

JL139BDA

更新时间： 2024-11-13 11:07:07
品牌 Logo 应用领域
德州仪器 - TI 放大器放大器电路比较器
页数 文件大小 规格书
33页 1279K
描述
低功耗低失调电压四路比较器 | NAD | 14 | -55 to 125

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JL139BDA 技术参数

是否Rohs认证： 不符合生命周期：Active
零件包装代码：DFP包装说明：DFP, DIP14,.3
针数：14Reach Compliance Code：not_compliant
ECCN代码：EAR99HTS代码：8542.39.00.01
Factory Lead Time：6 weeks风险等级：1.49
放大器类型：COMPARATOR最大平均偏置电流 (IIB)：0.1 µA
25C 时的最大偏置电流 (IIB)：0.0001 µA最大输入失调电压：5000 µV
JESD-30 代码：R-GDFP-F14JESD-609代码：e0
长度：9.9 mm湿度敏感等级：1
功能数量：4端子数量：14
最高工作温度：125 °C最低工作温度：-55 °C
输出类型：OPEN-COLLECTOR封装主体材料：CERAMIC, GLASS-SEALED
封装代码：DFP封装等效代码：DIP14,.3
封装形状：RECTANGULAR封装形式：FLATPACK
包装方法：TUBE峰值回流温度（摄氏度）：NOT SPECIFIED
电源：+-2.5/+-18/5/36 V认证状态：Not Qualified
标称响应时间：7000 ns筛选级别：38535Q/M;38534H;883B
座面最大高度：2.02 mm子类别：Comparator
最大压摆率：0.5 mA供电电压上限：36 V
标称供电电压 (Vsup)：30 V表面贴装：YES
技术：BIPOLAR温度等级：MILITARY
端子面层：Tin/Lead (Sn/Pb)端子形式：FLAT
端子节距：1.27 mm端子位置：DUAL
处于峰值回流温度下的最长时间：NOT SPECIFIED宽度：6.35 mm

JL139BDA 数据手册

 浏览型号JL139BDA的Datasheet PDF文件第2页浏览型号JL139BDA的Datasheet PDF文件第3页浏览型号JL139BDA的Datasheet PDF文件第4页浏览型号JL139BDA的Datasheet PDF文件第5页浏览型号JL139BDA的Datasheet PDF文件第6页浏览型号JL139BDA的Datasheet PDF文件第7页 
LM139, LM239, LM339  
LM139A, LM239A, LM339A  
LM2901, LM2901AV, LM2901V  
www.ti.com  
SLCS006S –OCTOBER 1979–REVISED AUGUST 2012  
QUAD DIFFERENTIAL COMPARATORS  
Check for Samples: LM139, LM239, LM339, LM139A, LM239A, LM339A, LM2901, LM2901AV, LM2901V  
1
FEATURES  
•
Wide Supply Ranges  
•
•
•
•
Low Input Bias Current: 25 nA (Typ)  
Low Input Offset Current: 3 nA (Typ) (LM139)  
Low Input Offset Voltage: 2 mV (Typ)  
–
Single Supply: 2 V to 36 V  
(Tested to 30 V for Non-V Devices and 32 V  
for V-Suffix Devices)  
Common-Mode Input Voltage Range Includes  
Ground  
–
Dual Supplies: ±1 V to ±18 V  
(Tested to ±15 V for Non-V Devices and  
±16 V for V-Suffix Devices)  
•
Differential Input Voltage Range Equal to  
Maximum-Rated Supply Voltage: ±36 V  
•
Low Supply-Current Drain Independent of  
Supply Voltage: 0.8 mA (Typ)  
•
•
Low Output Saturation Voltage  
Output Compatible With TTL, MOS, and CMOS  
LM139, LM139A. . . D, J, OR W PACKAGE  
LM239 . . . D, N, OR PW PACKAGE  
LM239A . . . D PACKAGE  
LM139, LM139A. . . FK PACKAGE  
(TOP VIEW)  
LM339, LM339A. . . D, DB, N, NS, OR PW PACKAGE  
LM2901 . . . D, N, NS, OR PW PACKAGE  
(TOP VIEW)  
3
2
1 20 19  
18  
GND  
NC  
VCC  
NC  
4
5
6
7
8
1
2
3
4
5
6
7
14  
13  
12  
11  
10  
9
1OUT  
2OUT  
VCC  
OUT3  
OUT4  
GND  
4IN+  
4IN-  
17  
16  
15  
14  
4IN+  
NC  
2IN-  
NC  
2IN-  
4IN-  
2IN+  
2IN+  
1IN-  
9 10 11 12 13  
3IN+  
3IN-  
8
1IN+  
NC - No inter nal connection  
DESCRIPTION/ORDERING INFORMATION  
These devices consist of four independent voltage comparators that are designed to operate from a single power  
supply over a wide range of voltages. Operation from dual supplies also is possible, as long as the difference  
between the two supplies is 2 V to 36 V, and VCC is at least 1.5 V more positive than the input common-mode  
voltage. Current drain is independent of the supply voltage. The outputs can be connected to other open-  
collector outputs to achieve wired-AND relationships.  
The LM139 and LM139A are characterized for operation over the full military temperature range of –55°C to  
125°C. The LM239 and LM239A are characterized for operation from –25°C to 125°C. The LM339 and LM339A  
are characterized for operation from 0°C to 70°C. The LM2901, LM2901AV, and LM2901V are characterized for  
operation from –40°C to 125°C.  
1
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of  
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.  
PRODUCTION DATA information is current as of publication date.  
Copyright © 1979–2012, Texas Instruments Incorporated  
Products conform to specifications per the terms of the Texas  
On products compliant to MIL-PRF-38535, all parameters are  
Instruments standard warranty. Production processing does not  
tested unless otherwise noted. On all other products, production  
necessarily include testing of all parameters.  
processing does not necessarily include testing of all parameters.  
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