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JDH2S02SL PDF预览

JDH2S02SL

更新时间: 2024-11-06 14:56:11
品牌 Logo 应用领域
东芝 - TOSHIBA /
页数 文件大小 规格书
6页 124K
描述
10 V/0.01 A Schottky Barrier Diode, SOD-962(SL2)

JDH2S02SL 技术参数

是否Rohs认证: 符合生命周期:Active
Reach Compliance Code:unknownECCN代码:EAR99
HTS代码:8541.10.00.60风险等级:5.23
二极管类型:MIXER DIODE峰值回流温度(摄氏度):NOT SPECIFIED
处于峰值回流温度下的最长时间:NOT SPECIFIEDBase Number Matches:1

JDH2S02SL 数据手册

 浏览型号JDH2S02SL的Datasheet PDF文件第2页浏览型号JDH2S02SL的Datasheet PDF文件第3页浏览型号JDH2S02SL的Datasheet PDF文件第4页浏览型号JDH2S02SL的Datasheet PDF文件第5页浏览型号JDH2S02SL的Datasheet PDF文件第6页 
JDH2S02SL  
Schottky Barrier Diode Silicon Epitaxial Planar  
JDH2S02SL  
1. Applications  
Radio-Frequency Power Detectors  
2. Features  
Suitable for reducing the product size due to the use of a small two-pin package supporting high-density  
mounting  
3. Packaging and Internal Circuit  
1: Cathode  
2: Anode  
SL2  
4. Absolute Maximum Ratings (Note) (Unless otherwise specified, Ta = 25 )  
Characteristics  
Symbol  
Note  
Rating  
Unit  
Reverse voltage  
Forward current  
VR  
IF  
10  
10  
V
mA  
Junction temperature  
Storage temperature  
Tj  
125  
Tstg  
-55 to 125  
Note: Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the  
significant change in temperature, etc.) may cause this product to decrease in the reliability significantly even  
if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum  
ratings.  
Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook  
("Handling Precautions"/"Derating Concept and Methods") and individual reliability data (i.e. reliability test  
report and estimated failure rate, etc).  
Note: This device is sensitive to electrostatic discharge (ESD). Extreme ESD conditions should be using proper  
antistatic precautions for the worktable, operator, solder iron and so on.  
Start of commercial production  
2015-09  
©2015 Toshiba Corporation  
2015-11-13  
Rev.2.0  
1

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