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JANTXVR2N7426

更新时间: 2023-06-19 14:26:27
品牌 Logo 应用领域
英飞凌 - INFINEON /
页数 文件大小 规格书
22页 232K
描述
Rad hard, -200V, -27A, single, P-channel MOSFET, R4 in a TO-254AA package - TO-254AA, 100 krad(Si) TID, QPL

JANTXVR2N7426 数据手册

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The documentation and process conversion measures  
necessary to comply with this document shall be  
completed by 6 February 2014.  
INCH-POUND  
MIL-PRF-19500/660E  
6 December 2013  
SUPERSEDING  
MIL-PRF-19500/660D  
11 February 2013  
PERFORMANCE SPECIFICATION SHEET  
SEMICONDUCTOR DEVICE, FIELD EFFECT RADIATION HARDENED  
TRANSISTOR, P-CHANNEL SILICON, TYPES 2N7424, 2N7425, AND 2N7426,  
JANTXVR, JANTXVF, JANSR, AND JANSF  
This specification is approved for use by all Departments  
and Agencies of the Department of Defense.  
The requirements for acquiring the product described herein shall consist of  
this specification sheet and MIL-PRF-19500.  
1. SCOPE  
1.1 Scope. This specification covers the performance requirements for a P-channel, enhancement-mode,  
MOSFET, radiation hardened, power transistor. Two levels of product assurance are provided for each device type  
as specified in MIL-PRF-19500, with avalanche energy maximum rating (EAS) and maximum avalanche current (IAS).  
See 6.5 for JANHC and JANKC die versions.  
1.2 Physical dimensions. See figure 1, TO-254AA.  
1.3 Maximum ratings. Unless otherwise specified, TA = +25oC.  
Type  
PT (1)  
TC =  
+25°C  
PT  
TA =  
+25°C  
VDS  
VDG  
VGS  
ID1 (3) (4) ID2 (3)(4)  
IS  
IDM  
(5)  
TJ  
and  
TSTG  
R θJC  
(2)  
TC =  
TC =+25°C  
+100°C  
W
W
V dc  
V dc  
V dc  
A dc  
A dc  
A dc  
A (pk)  
°C/W  
°C  
2N7424  
2N7425  
2N7426  
250  
250  
250  
3.0  
3.0  
3.0  
-60  
-60  
-35  
-35  
-27  
-30  
-24  
-17  
-35  
-35  
-27  
-140  
-140  
-108  
0.50  
0.50  
0.50  
±20  
±20  
±20  
-55  
to  
+150  
-100  
-200  
-100  
-200  
(1) Derate linearly 2.0 W/°C for TC > +25°C.  
(2) See figure 2, thermal impedance curves.  
(3) The following formula derives the maximum theoretical ID limit. ID is limited by package and internal  
construction.  
-
TJM TC  
( on ) at  
TJM  
=
ID  
(
)
x
(
)
RθJC  
RDS  
(4) See figure 3, maximum drain current graphs.  
(5) IDM = 4 x ID1 as calculated in note 3.  
Comments, suggestions, or questions on this document should be addressed to DLA Land and Maritime,  
ATTN: VAC, P.O. Box 3990, Columbus, OH 43218-3990, or emailed to Semiconductor@dla.mil. Since contact  
information can change, you may want to verify the currency of this address information using the ASSIST  
Online database at https://assist.dla.mil.  
AMSC N/A  
FSC 5961  
 

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