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JANSR2N7422 PDF预览

JANSR2N7422

更新时间: 2024-11-04 22:55:35
品牌 Logo 应用领域
英飞凌 - INFINEON 晶体晶体管开关脉冲局域网
页数 文件大小 规格书
8页 129K
描述
RADIATION HARDENED POWER MOSFET THRU-HOLE (TO-254AA)

JANSR2N7422 技术参数

是否Rohs认证: 不符合生命周期:Active
包装说明:FLANGE MOUNT, S-CSFM-P3Reach Compliance Code:compliant
ECCN代码:EAR99风险等级:5.79
其他特性:HIGH RELIABILITY雪崩能效等级(Eas):500 mJ
配置:SINGLE WITH BUILT-IN DIODE最小漏源击穿电压:100 V
最大漏极电流 (ID):22 A最大漏源导通电阻:0.085 Ω
FET 技术:METAL-OXIDE SEMICONDUCTORJEDEC-95代码:TO-254AA
JESD-30 代码:S-CSFM-P3JESD-609代码:e0
元件数量:1端子数量:3
工作模式:ENHANCEMENT MODE封装主体材料:CERAMIC, METAL-SEALED COFIRED
封装形状:SQUARE封装形式:FLANGE MOUNT
峰值回流温度(摄氏度):NOT SPECIFIED极性/信道类型:P-CHANNEL
最大脉冲漏极电流 (IDM):88 A认证状态:Qualified
参考标准:MIL-19500/662表面贴装:NO
端子面层:Tin/Lead (Sn/Pb)端子形式:PIN/PEG
端子位置:SINGLE处于峰值回流温度下的最长时间:NOT SPECIFIED
晶体管应用:SWITCHING晶体管元件材料:SILICON
Base Number Matches:1

JANSR2N7422 数据手册

 浏览型号JANSR2N7422的Datasheet PDF文件第2页浏览型号JANSR2N7422的Datasheet PDF文件第3页浏览型号JANSR2N7422的Datasheet PDF文件第4页浏览型号JANSR2N7422的Datasheet PDF文件第5页浏览型号JANSR2N7422的Datasheet PDF文件第6页浏览型号JANSR2N7422的Datasheet PDF文件第7页 
PD - 90889D  
IRHM9150  
JANSR2N7422  
RADIATION HARDENED  
POWER MOSFET  
THRU-HOLE (TO-254AA)  
100V, P-CHANNEL  
REF: MIL-PRF-19500/662  
RAD HardHEXFET® TECHNOLOGY  
Product Summary  
Part Number Radiation Level RDS(on)  
ID  
QPL Part Number  
JANSR2N7422  
JANSF2N7422  
IRHM9150  
100K Rads (Si) 0.080Ω  
300K Rads (Si) 0.080Ω  
-22A  
-22A  
IRHM93150  
International Rectifier’s RADHard HEXFETTM technol-  
ogy provides high performance power MOSFETs for  
space applications. This technology has over a de-  
cade of proven performance and reliability in satellite  
applications. These devices have been character-  
ized for bothTotal Dose and Single Event Effects (SEE).  
The combination of low Rdson and low gate charge  
reduces the power losses in switching applications  
such as DC to DC converters and motor control. These  
devices retain all of the well established advantages  
of MOSFETs such as voltage control, fast switching,  
ease of paralleling and temperature stability of elec-  
trical parameters.  
TO-254AA  
Features:  
n
n
n
n
n
n
n
n
n
n
Single Event Effect (SEE) Hardened  
Low RDS(on)  
LowTotal Gate Charge  
ProtonTolerant  
SimpleDriveRequirements  
EaseofParalleling  
Hermetically Sealed  
Surface Mount  
Ceramic Package  
LightWeight  
Absolute Maximum Ratings  
Pre-Irradiation  
Parameter  
Units  
I
@ V  
@ V  
= -12V, T = 25°C Continuous Drain Current  
-22  
-14  
D
D
GS  
GS  
C
A
I
= -12V, T = 100°C Continuous Drain Current  
C
I
Pulsed Drain Current  
Max. Power Dissipation  
Linear Derating Factor  
-88  
DM  
@ T = 25°C  
P
D
150  
W
W/°C  
V
C
1.2  
V
GS  
Gate-to-SourceVoltage  
±20  
E
Single Pulse Avalanche Energy ➀  
Avalanche Current ➀  
500  
mJ  
A
AS  
I
-22  
AR  
E
Repetitive Avalanche Energy ➀  
Peak Diode Recovery dv/dt ➀  
Operating Junction  
15  
mJ  
AR  
dv/dt  
-23  
V/ns  
T
-55 to 150  
J
oC  
g
T
STG  
StorageTemperature Range  
Lead Temperature  
Weight  
300 ( 0.063 in. (1.6mm) from case for 10s)  
9.3 (typical)  
For footnotes refer to the last page  
www.irf.com  
1
2/18/03  

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