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JANSH2N7268D PDF预览

JANSH2N7268D

更新时间: 2024-01-02 05:19:45
品牌 Logo 应用领域
英飞凌 - INFINEON 局域网开关脉冲晶体管
页数 文件大小 规格书
12页 299K
描述
Power Field-Effect Transistor, 34A I(D), 100V, 0.076ohm, 1-Element, N-Channel, Silicon, Metal-oxide Semiconductor FET, TO-254AA

JANSH2N7268D 技术参数

是否无铅: 含铅是否Rohs认证: 不符合
生命周期:Obsolete包装说明:FLANGE MOUNT, S-MSFM-P3
Reach Compliance Code:compliantECCN代码:EAR99
风险等级:5.72其他特性:RADIATION HARDENED
雪崩能效等级(Eas):500 mJ外壳连接:ISOLATED
配置:SINGLE WITH BUILT-IN DIODE最小漏源击穿电压:100 V
最大漏极电流 (ID):34 A最大漏源导通电阻:0.076 Ω
FET 技术:METAL-OXIDE SEMICONDUCTORJEDEC-95代码:TO-254AA
JESD-30 代码:S-MSFM-P3JESD-609代码:e0
元件数量:1端子数量:3
工作模式:ENHANCEMENT MODE最高工作温度:150 °C
封装主体材料:METAL封装形状:SQUARE
封装形式:FLANGE MOUNT峰值回流温度(摄氏度):NOT SPECIFIED
极性/信道类型:N-CHANNEL功耗环境最大值:150 W
最大脉冲漏极电流 (IDM):136 A认证状态:Not Qualified
参考标准:MILITARY STANDARD (USA)表面贴装:NO
端子面层:TIN LEAD端子形式:PIN/PEG
端子位置:SINGLE处于峰值回流温度下的最长时间:NOT SPECIFIED
晶体管应用:SWITCHING晶体管元件材料:SILICON
最大关闭时间(toff):300 ns最大开启时间(吨):235 ns
Base Number Matches:1

JANSH2N7268D 数据手册

 浏览型号JANSH2N7268D的Datasheet PDF文件第2页浏览型号JANSH2N7268D的Datasheet PDF文件第3页浏览型号JANSH2N7268D的Datasheet PDF文件第4页浏览型号JANSH2N7268D的Datasheet PDF文件第5页浏览型号JANSH2N7268D的Datasheet PDF文件第6页浏览型号JANSH2N7268D的Datasheet PDF文件第7页 
PD - 90675B  
IRHM7150  
IRHM8150  
JANSR2N7268  
JANSH2N7268  
N CHANNEL  
REPETITIVE AVALANCHE AND dv/dt RATED  
HEXFET® TRANSISTOR  
MEGA RAD HARD  
Product Summary  
100Volt, 0.065, MEGA RAD HARD HEXFET  
International Rectifier’s RAD HARD technology  
HEXFETs demonstrate excellent threshold voltage  
stability and breakdown voltage stability at total  
radiaition doses as high as 1x106 Rads(Si). Under  
identical pre- and post-irradiation test conditions, In-  
ternational Rectifier’s RAD HARD HEXFETs retain  
identical electrical specifications up to 1 x 105 Rads  
(Si) total dose. No compensation in gate drive circuitry  
is required. These devices are also capable of surviv-  
ing transient ionization pulses as high as 1 x 1012 Rads  
(Si)/Sec, and return to normal operation within a few  
microseconds. Since the RAD HARD process utilizes  
International Rectifier’s patented HEXFET technology,  
the user can expect the highest quality and reliability  
in the industry.  
Part Number  
IRHM7150  
IRHM8150  
BVDSS  
100V  
100V  
RDS(on)  
0.065Ω  
0.065Ω  
ID  
34A  
34A  
Features:  
n
n
n
n
n
n
n
n
n
n
n
n
n
Radiation Hardened up to 1 x 106 Rads (Si)  
Single Event Burnout (SEB) Hardened  
Single Event Gate Rupture (SEGR) Hardened  
Gamma Dot (Flash X-Ray) Hardened  
Neutron Tolerant  
Identical Pre- and Post-Electrical Test Conditions  
Repetitive Avalanche Rating  
Dynamic dv/dt Rating  
Simple Drive Requirements  
Ease of Paralleling  
Hermetically Sealed  
RAD HARD HEXFET transistors also feature all of  
the well-established advantages of MOSFETs, such  
as voltage control, very fast switching, ease of paral-  
leling and temperature stability of the electrical pa-  
rameters. They are well-suited for applications such  
as switching power supplies, motor controls, invert-  
ers, choppers, audio amplifiers and high-energy  
pulse circuits in space and weapons environments.  
Electrically Isolated  
Ceramic Eyelets  
Pre-Irradiation  
Absolute Maximum Ratings   
Parameter  
IRHM7150, IRHM8150  
Units  
I
@ V  
@ V  
= 12V, T = 25°C  
Continuous Drain Current  
34  
D
GS  
C
A
I
= 12V, T = 100°C Continuous Drain Current  
21  
D
GS  
C
I
Pulsed Drain Current ‚  
Max. Power Dissipation  
Linear Derating Factor  
Gate-to-Source Voltage  
136  
DM  
@ T = 25°C  
P
150  
W
W/°C  
V
D
C
1.2  
V
±20  
GS  
E
Single Pulse Avalanche Energy ƒ  
Avalanche Current ‚  
500  
mJ  
A
AS  
I
34  
AR  
E
Repetitive Avalanche Energy‚  
Peak Diode Recovery dv/dt „  
Operating Junction  
15  
mJ  
V/ns  
AR  
dv/dt  
5.5  
T
-55 to 150  
J
T
Storage Temperature Range  
oC  
g
STG  
Lead Temperature  
Weight  
300 (0.063 in. (1.6mm) from case for 10s)  
9.3 (typical)  
www.irf.com  
1
10/15/98  

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