DATASHEET
IS-1825xSRH, IS-1825BSEH, ISL71823xSRH
Single Event and Total Dose Hardened, High-Speed Dual Output PWMs
FN9065
Rev.7.01
Jan 6, 2022
The IS-1825ASRH, IS-1825BSRH, IS-1825BSEH,
ISL71823ASRH, and ISL71823BSRH are single event
Features
• Electrically screened to DLA SMD 5962-02511
• QML qualified per MIL-PRF-38535 requirements
• Oscillator frequency: 1MHz (max)
• High output drive current: 1A peak (typ)
• Low startup current: 300µA (max)
• Undervoltage Lockout
and total dose hardened pulse width modulators designed
to be used in high-frequency switching power supplies in
either voltage or current-mode configurations. These
devices include a precision voltage reference, a low
power start-up circuit, a high-frequency oscillator, a
wide-band error amplifier, and a fast current-limit
comparator.
The IS-1825xSRH and IS-1825xSEH feature dual,
alternating output operating from zero to less than 50%
duty cycle, and the ISL71823xSRH features dual
in-phase output operating from zero to less than 100%
duty cycle. The B versions of the parts test the delay from
clock out to PWM output switching after power has been
• Start threshold: 8.8V (max)
• Stop threshold: 7.6V (min)
• Hysteresis: 300mV (min)
• Pulse-by-pulse current limiting
applied to the modulator (t
) (see Figure 2 on page 9).
• Programmable leading edge blanking
PWM
The SEH parts are wafer-by-wafer acceptance tested to
50krad(Si) at a low dose rate of <10mrad(Si)/s.
• Radiation acceptance testing - IS-1825xSRH,
ISL71823xSRH
Constructed with the Rad-hard Silicon Gate (RSG)
dielectrically isolated BiCMOS process, these devices
are immune to single-event latch-up and have been
specifically designed to provide a high level of immunity
to single-event transients. All specified parameters are
established and tested for 300krad(Si) total dose
performance.
• High Dose Rate (HDR) (50-300rad(Si)/s):
300krad(Si)
• Radiation acceptance testing - IS-1825BSEH
• High Dose Rate (HDR) (50-300rad(Si)/s):
300krad(Si)
• Low Lose Rate (LDR) (0.01rad(Si)/s): 50krad(Si)
• Latch-up immune (dielectrically isolated)
• SEE hardness (see SEE report for details)
The devices are offered in a 16 Ld CDIP or a 20 Ld
CDFP and fully specified to across the temperature range
of -50°C to +125°C.
2
• SEU immune: LET= 35MeV•cm /mg
Applications
• Voltage or current mode switching power supplies
• Control of high current MOSFET drivers
• Motor speed and direction control
Table 1. Key Differences Between Family of Parts
Clock-to-PWM
Startup Test
Part Number
Dual Outputs
IS-1825ASRH
IS-1825BSRH
IS-1825BSEH
Out of Phase
Out of Phase
Out of Phase
In Phase
-
Yes
Yes
-
ISL71823ASRH
ISL71823BSRH
In Phase
Yes
FN9065 Rev.7.01
Jan 6, 2022
Page 1 of 24
© 2002 Renesas Electronics