Datasheet > ISL71823ASRH

ISL71823ASRH

更新时间： 2023-12-20 18:44:28

品牌	Logo	应用领域
瑞萨 - RENESAS		/
页数	文件大小	规格书
25页	635K
描述
Single Event and Total Dose Hardened, High-Speed, Dual Output PWMs

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ISL71823ASRH 数据手册

DATASHEET

IS-1825xSRH, IS-1825BSEH, ISL71823xSRH

Single Event and Total Dose Hardened, High-Speed Dual Output PWMs

FN9065

Rev.7.01

Jan 6, 2022

The IS-1825ASRH, IS-1825BSRH, IS-1825BSEH,

ISL71823ASRH, and ISL71823BSRH are single event

Features

• Electrically screened to DLA SMD 5962-02511

• QML qualified per MIL-PRF-38535 requirements

• Oscillator frequency: 1MHz (max)

• High output drive current: 1A peak (typ)

• Low startup current: 300µA (max)

• Undervoltage Lockout

and total dose hardened pulse width modulators designed

to be used in high-frequency switching power supplies in

either voltage or current-mode configurations. These

devices include a precision voltage reference, a low

power start-up circuit, a high-frequency oscillator, a

wide-band error amplifier, and a fast current-limit

comparator.

The IS-1825xSRH and IS-1825xSEH feature dual,

alternating output operating from zero to less than 50%

duty cycle, and the ISL71823xSRH features dual

in-phase output operating from zero to less than 100%

duty cycle. The B versions of the parts test the delay from

clock out to PWM output switching after power has been

• Start threshold: 8.8V (max)

• Stop threshold: 7.6V (min)

• Hysteresis: 300mV (min)

• Pulse-by-pulse current limiting

applied to the modulator (t

) (see Figure 2 on page 9).

• Programmable leading edge blanking

PWM

The SEH parts are wafer-by-wafer acceptance tested to

50krad(Si) at a low dose rate of <10mrad(Si)/s.

• Radiation acceptance testing - IS-1825xSRH,

ISL71823xSRH

Constructed with the Rad-hard Silicon Gate (RSG)

dielectrically isolated BiCMOS process, these devices

are immune to single-event latch-up and have been

specifically designed to provide a high level of immunity

to single-event transients. All specified parameters are

established and tested for 300krad(Si) total dose

performance.

• High Dose Rate (HDR) (50-300rad(Si)/s):

300krad(Si)

• Radiation acceptance testing - IS-1825BSEH

• High Dose Rate (HDR) (50-300rad(Si)/s):

300krad(Si)

• Low Lose Rate (LDR) (0.01rad(Si)/s): 50krad(Si)

• Latch-up immune (dielectrically isolated)

• SEE hardness (see SEE report for details)

The devices are offered in a 16 Ld CDIP or a 20 Ld

CDFP and fully specified to across the temperature range

of -50°C to +125°C.

• SEU immune: LET= 35MeV•cm /mg

Applications

• Voltage or current mode switching power supplies

• Control of high current MOSFET drivers

• Motor speed and direction control

Table 1. Key Differences Between Family of Parts

Clock-to-PWM

Startup Test

Part Number

Dual Outputs

IS-1825ASRH

IS-1825BSRH

IS-1825BSEH

Out of Phase

In Phase

Yes

ISL71823ASRH

ISL71823BSRH

In Phase

Yes

FN9065 Rev.7.01

Jan 6, 2022

Page 1 of 24

12 3 4 5 6 7...25

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