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IS61QDP2B22M36A1-333B4L PDF预览

IS61QDP2B22M36A1-333B4L

更新时间: 2024-09-16 22:58:51
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美国芯成 - ISSI 静态存储器
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31页 809K
描述
IC SRAM 72M PARALLEL 165LFBGA

IS61QDP2B22M36A1-333B4L 数据手册

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IS61QDP2B24M18A/A1/A2  
IS61QDP2B22M36A/A1/A2  
4Mx18, 2Mx36  
FEBRUARY 2014  
72Mb QUADP (Burst 2) Synchronous SRAM  
(2.0 CYCLE READ LATENCY)  
DESCRIPTION  
The  
FEATURES  
2Mx36 and 4Mx18 configuration available.  
and  
On-chip Delay-Locked Loop (DLL) for wide data  
valid window.  
are synchronous, high-  
performance CMOS static random access memory (SRAM)  
devices. These SRAMs have separate I/Os, eliminating the  
need for high-speed bus turnaround. The rising edge of K  
clock initiates the read/write operation, and all internal  
operations are self-timed. Refer to the  
Separate independent read and write ports with  
concurrent read and write operations.  
Synchronous pipeline read with EARLY write  
operation.  
for a description of the basic  
Double Data Rate (DDR) interface for read and  
write input ports.  
operations of these  
SRAMs. Read and  
write addresses are registered on alternating rising edges of  
the K clock. Read and write performed in double data rate.  
2.0 Cycle read latency.  
Fixed 2-bit burst for read and write operations.  
Clock stop support.  
The following are registered internally on the rising edge of  
the K clock:  
Two input clocks (K and K#) for address and control  
registering at rising edges only.  
Read address  
Two echo clocks (CQ and CQ#) that are delivered  
simultaneously with data.  
Read enable  
Write enable  
Data valid pin (QVLD).  
Data-in for early writes  
+1.8V core power supply and 1.5, 1.8V VDDQ, used  
with 0.75, 0.9V VREF.  
The following are registered on the rising edge of the K#  
clock:  
HSTL input and output interface.  
Write address  
Registered addresses, write and read controls, byte  
writes, data in, and data outputs.  
Byte writes  
Full data coherency.  
Data-in for second burst addresses  
Boundary scan using limited set of JTAG 1149.1  
functions.  
Byte writes can change with the corresponding data-in to  
enable or disable writes on a per-byte basis. An internal write  
buffer enables the data-ins to be registered half a cycle  
earlier than the write address. The first data-in burst is  
clocked at the same time as the write command signal, and  
the second burst is timed to the following rising edge of the  
K# clock.  
Byte Write capability.  
Fine ball grid array (FBGA) package option:  
13mmx15mm and 15mmx17mm body size  
165-ball (11 x 15) array  
Programmable impedance output drivers via 5x  
user-supplied precision resistor.  
ODT (On Die Termination) feature is supported  
optionally on data input, K/K#, and BWx#.  
During the burst read operation, the data-outs from the first  
bursts are updated from output registers of the second rising  
edge of the K# clock (starting two cycles later after read  
command). The data-outs from the second bursts are  
updated with the third rising edge of the K clock. The K and  
K# clocks are used to time the data-outs.  
The end of top mark (A/A1/A2) is to define options.  
: Don’t care ODT function  
and pin connection  
1 : Option1  
2 : Option2  
The device is operated with a single +1.8V power supply and  
is compatible with HSTL I/O interface.  
Refer to more detail description at page 6 for each  
ODT option.  
Copyright © 2014 Integrated Silicon Solution, Inc. All rights reserved. ISSI reserves the right to make changes to this specification and its products at any time  
without notice. ISSI assumes no liability arising out of the application or use of any information, products or services described herein. Customers are advised to  
obtain the latest version of this device specification before relying on any published information and before placing orders for products.  
Integrated Silicon Solution, Inc. does not recommend the use of any of its products in life support applications where the failure or malfunction of the product can  
reasonably be expected to cause failure of the life support system or to significantly affect its safety or effectiveness. Products are not authorized for use in such  
applications unless Integrated Silicon Solution, Inc. receives written assurance to its satisfaction, that:  
a.) the risk of injury or damage has been minimized;  
b.) the user assume all such risks; and  
c.) potential liability of Integrated Silicon Solution, Inc is adequately protected under the circumstances  
Integrated Silicon Solution, Inc.- www.issi.com  
Rev. B  
1
02/11/2014  

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