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IS61QDB21M18A-250B4LI PDF预览

IS61QDB21M18A-250B4LI

更新时间: 2024-10-13 21:11:35
品牌 Logo 应用领域
美国芯成 - ISSI 时钟静态存储器内存集成电路
页数 文件大小 规格书
29页 582K
描述
QDR SRAM, 1MX18, 0.45ns, CMOS, PBGA165, 13 X 15 MM, 1.40 MM HEIGHT, LEAD FREE, LFBGA-165

IS61QDB21M18A-250B4LI 技术参数

是否Rohs认证: 符合生命周期:Active
零件包装代码:BGA包装说明:LBGA, BGA165,11X15,40
针数:165Reach Compliance Code:compliant
ECCN代码:3A991.B.2.AHTS代码:8542.32.00.41
Factory Lead Time:10 weeks风险等级:5.68
最长访问时间:0.45 ns其他特性:PIPELINED ARCHITECTURE
最大时钟频率 (fCLK):250 MHzI/O 类型:SEPARATE
JESD-30 代码:R-PBGA-B165长度:15 mm
内存密度:18874368 bit内存集成电路类型:QDR SRAM
内存宽度:18功能数量:1
端子数量:165字数:1048576 words
字数代码:1000000工作模式:SYNCHRONOUS
最高工作温度:85 °C最低工作温度:-40 °C
组织:1MX18输出特性:3-STATE
封装主体材料:PLASTIC/EPOXY封装代码:LBGA
封装等效代码:BGA165,11X15,40封装形状:RECTANGULAR
封装形式:GRID ARRAY, LOW PROFILE并行/串行:PARALLEL
电源:1.5/1.8,1.8 V认证状态:Not Qualified
座面最大高度:1.4 mm最大待机电流:0.27 A
最小待机电流:1.7 V子类别:SRAMs
最大压摆率:0.95 mA最大供电电压 (Vsup):1.89 V
最小供电电压 (Vsup):1.71 V标称供电电压 (Vsup):1.8 V
表面贴装:YES技术:CMOS
温度等级:INDUSTRIAL端子形式:BALL
端子节距:1 mm端子位置:BOTTOM
宽度:13 mmBase Number Matches:1

IS61QDB21M18A-250B4LI 数据手册

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IS61QDB21M18A  
IS61QDB251236A  
1Mx18, 512Kx36  
18Mb QUAD (Burst 2) Synchronous SRAM  
JANUARY 2013  
DESCRIPTION  
FEATURES  
The  
and  
are  
512Kx36 and 1Mx18 configuration available.  
synchronous, high-performance CMOS static random access  
memory (SRAM) devices. These SRAMs have separate I/Os,  
eliminating the need for high-speed bus turnaround. The  
rising edge of K clock initiates the read/write operation, and  
all internal operations are self-timed. Refer to the  
for a description of the  
On-chip Delay-Locked Loop (DLL) for wide data  
valid window.  
Separate independent read and write ports with  
concurrent read and write operations.  
Synchronous pipeline read with EARLY write  
operation.  
basic operations of these  
SRAMs.  
Double Data Rate (DDR) interface for read and  
write input ports.  
The input address bus operates at double data rate. The  
following are registered internally on the rising edge of the K  
clock:  
Fixed 2-bit burst for read and write operations.  
Clock stop support.  
Read address  
Two input clocks (K and K#) for address and control  
registering at rising edges only.  
Read enable  
Write enable  
Two output clocks (C and C#) for data output control.  
Byte writes  
Two echo clocks (CQ and CQ#) that are delivered  
simultaneously with data.  
Data-in for early writes  
+1.8V core power supply and 1.5, 1.8V VDDQ, used  
with 0.75, 0.9V VREF.  
The following are registered on the rising edge of the K#  
clock:  
HSTL input and output levels.  
Write address  
Registered addresses, write and read controls, byte  
writes, data in, and data outputs.  
Byte writes  
Data-in for second burst addresses  
Full data coherency.  
Boundary scan using limited set of JTAG 1149.1  
functions.  
Byte writes can change with the corresponding data-in to  
enable or disable writes on a per-byte basis. An internal write  
buffer enables the data-ins to be registered half a cycle  
earlier than the write address. The first data-in burst is  
clocked at the same time as the write command signal, and  
the second burst is timed to the following rising edge of the  
K# clock.  
Byte write capability.  
Fine ball grid array (FBGA) package:  
13mmx15mm and 15mmx17mm body size  
165-ball (11 x 15) array  
Programmable impedance output drivers via 5x  
user-supplied precision resistor.  
During the burst read operation, the data-outs from the first  
bursts are updated from output registers of the second rising  
edge of the C# clock (starting 1.5 cycles later after read  
command). The data-outs from the second bursts are  
updated with the third rising edge of the C clock. The K and  
K# clocks are used to time the data-outs whenever the C and  
C# clocks are tied high.  
The device is operated with a single +1.8V power supply and  
is compatible with HSTL I/O interfaces.  
Copyright © 2013 Integrated Silicon Solution, Inc. All rights reserved. ISSI reserves the right to make changes to this specification and its products at any time  
without notice. ISSI assumes no liability arising out of the application or use of any information, products or services described herein. Customers are advised to  
obtain the latest version of this device specification before relying on any published information and before placing orders for products.  
Integrated Silicon Solution, Inc. does not recommend the use of any of its products in life support applications where the failure or malfunction of the product can  
reasonably be expected to cause failure of the life support system or to significantly affect its safety or effectiveness. Products are not authorized for use in such  
applications unless Integrated Silicon Solution, Inc. receives written assurance to its satisfaction, that:  
a.) the risk of injury or damage has been minimized;  
b.) the user assume all such risks; and  
c.) potential liability of Integrated Silicon Solution, Inc is adequately protected under the circumstances  
Integrated Silicon Solution, Inc.- www.issi.com  
Rev. A  
1
1/2/2013  

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