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IS61DDB22M36-250M3 PDF预览

IS61DDB22M36-250M3

更新时间: 2024-11-18 05:39:35
品牌 Logo 应用领域
美国芯成 - ISSI 存储内存集成电路静态存储器双倍数据速率时钟
页数 文件大小 规格书
25页 601K
描述
72 Mb (2M x 36 & 4M x 18) DDR-II (Burst of 2) CIO Synchronous SRAMs

IS61DDB22M36-250M3 技术参数

是否无铅: 含铅是否Rohs认证: 不符合
生命周期:Obsolete零件包装代码:BGA
包装说明:15 X 17 MM, 1 MM PITCH, FBGA-165针数:165
Reach Compliance Code:compliantECCN代码:3A991.B.2.A
HTS代码:8542.32.00.41风险等级:5.75
Is Samacsys:N最长访问时间:0.35 ns
其他特性:PIPELINED ARCHITECTURE最大时钟频率 (fCLK):250 MHz
I/O 类型:COMMONJESD-30 代码:R-PBGA-B165
JESD-609代码:e0长度:17 mm
内存密度:75497472 bit内存集成电路类型:DDR SRAM
内存宽度:36功能数量:1
端子数量:165字数:2097152 words
字数代码:2000000工作模式:SYNCHRONOUS
最高工作温度:70 °C最低工作温度:
组织:2MX36输出特性:3-STATE
封装主体材料:PLASTIC/EPOXY封装代码:LBGA
封装等效代码:BGA165,11X15,40封装形状:RECTANGULAR
封装形式:GRID ARRAY, LOW PROFILE并行/串行:PARALLEL
峰值回流温度(摄氏度):NOT SPECIFIED电源:1.5/1.8,1.8 V
认证状态:Not Qualified座面最大高度:1.4 mm
最小待机电流:1.7 V子类别:SRAMs
最大压摆率:0.55 mA最大供电电压 (Vsup):1.89 V
最小供电电压 (Vsup):1.71 V标称供电电压 (Vsup):1.8 V
表面贴装:YES技术:CMOS
温度等级:COMMERCIAL端子面层:Tin/Lead (Sn/Pb)
端子形式:BALL端子节距:1 mm
端子位置:BOTTOM处于峰值回流温度下的最长时间:NOT SPECIFIED
宽度:15 mmBase Number Matches:1

IS61DDB22M36-250M3 数据手册

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72 Mb (2M x 3  
.
6 & 4M x 18)  
DDR-II (Burst of 2) CIO Synchronous SRAMs  
November 2009  
Two echo clocks (CQ and CQ) that are delivered  
simultaneously with data.  
Features  
2M x 36 or 4M x 18.  
• +1.8V core power supply and 1.5, 1.8V VDDQ  
used with 0.75, 0.9V VREF  
,
• On-chip delay-locked loop (DLL) for wide data  
valid window.  
.
• HSTL input and output levels.  
• Common data input/output bus.  
• Registered addresses, write and read controls,  
byte writes, data in, and data outputs.  
• Synchronous pipeline read with self-timed late  
write operation.  
• Full data coherency.  
• Double data rate (DDR-II) interface for read and  
• Boundary scan using limited set of JTAG 1149.1  
functions.  
write input ports.  
• Fixed 2-bit burst for read and write operations.  
• Clock stop support.  
• Byte write capability.  
• Fine ball grid array (FBGA) package  
- 15mm x 17mm body size  
- 1mm pitch  
Two input clocks (K and K) for address and con-  
trol registering at rising edges only.  
Two input clocks (C and C) for data output con-  
trol.  
- 165-ball (11 x 15) array  
• Programmable impedance output drivers via 5x  
user-supplied precision resistor.  
Industrial temperature available upon request.  
Description  
The 72Mb IS61DDB22M36 and  
The following are registered on the rising edge of  
the K clock:  
IS61DDB24M18 are synchronous, high-perfor-  
mance CMOS static random access memory  
(SRAM) devices. These SRAMs have a common I/O  
bus. The rising edge of K clock initiates the  
read/write operation, and all internal operations are  
self-timed.  
y
B te writes  
• Data-in for second burst addresses  
Byte writes can change with the corresponding data-  
in to enable or disable writes on a per-byte basis. An  
internal write buffer enables the data-ins to be regis-  
tered one cycle later than the write address. The first  
data-in burst is clocked with the rising edge of the  
next K clock, and the second burst is timed to the  
following rising edge of the K clock.  
Refer to the Timing Reference Diagram for Truth  
Table on page 8 for a description of the basic opera-  
tions of these DDR-II (Burst of 2) CIO SRAMs.  
The input addresses are registered on all rising  
edges of the K clock. The DQ bus operates at  
double data rate for reads and writes. The following  
are registered internally on the rising edge of the K  
clock:  
During the burst read operation, at the first burst the  
data-outs are updated from output registers off the  
second rising edge of the C clock (1.5 cycles later).  
At the second burst, the data-outs are updated with  
the third rising edge of the corresponding C clock  
(see page 9). The K and K clocks are used to time  
the data-outs whenever the C and C clocks are tied  
high.  
• Read and write addresses  
• Address load  
• Read/write enable  
y
B te writes  
• Data-in  
The device is operated with a single +1.8V power  
supply and is compatible with HSTL I/O interfaces.  
Integrated Silicon Solution, Inc.  
1
Rev. B  
11/10/09  

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