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IS23SC1604-X4I PDF预览

IS23SC1604-X4I

更新时间: 2024-12-01 03:00:03
品牌 Logo 应用领域
美国芯成 - ISSI 存储内存集成电路可编程只读存储器电动程控只读存储器电可擦编程只读存储器时钟
页数 文件大小 规格书
18页 78K
描述
16-KBIT SECURED SERIAL EEPROM

IS23SC1604-X4I 技术参数

是否无铅: 含铅是否Rohs认证: 不符合
生命周期:Obsolete零件包装代码:DIE
包装说明:DIE,针数:7
Reach Compliance Code:compliantECCN代码:EAR99
HTS代码:8542.32.00.51风险等级:5.88
Is Samacsys:N最大时钟频率 (fCLK):0.3 MHz
JESD-30 代码:R-XUUC-N7JESD-609代码:e0
内存密度:16384 bit内存集成电路类型:EEPROM
内存宽度:8功能数量:1
端子数量:7字数:2048 words
字数代码:2000工作模式:SYNCHRONOUS
最高工作温度:85 °C最低工作温度:-40 °C
组织:2KX8封装主体材料:UNSPECIFIED
封装代码:DIE封装形状:RECTANGULAR
封装形式:UNCASED CHIP并行/串行:SERIAL
峰值回流温度(摄氏度):240认证状态:Not Qualified
串行总线类型:3-WIRE最大供电电压 (Vsup):5.5 V
最小供电电压 (Vsup):4.5 V标称供电电压 (Vsup):5 V
表面贴装:YES技术:CMOS
温度等级:INDUSTRIAL端子面层:TIN LEAD
端子形式:NO LEAD端子位置:UPPER
处于峰值回流温度下的最长时间:30最长写入周期时间 (tWC):5 ms
Base Number Matches:1

IS23SC1604-X4I 数据手册

 浏览型号IS23SC1604-X4I的Datasheet PDF文件第2页浏览型号IS23SC1604-X4I的Datasheet PDF文件第3页浏览型号IS23SC1604-X4I的Datasheet PDF文件第4页浏览型号IS23SC1604-X4I的Datasheet PDF文件第5页浏览型号IS23SC1604-X4I的Datasheet PDF文件第6页浏览型号IS23SC1604-X4I的Datasheet PDF文件第7页 
®
IS23SC1604  
ISSI  
ADVANCE INFORMATION  
APRIL 2003  
16-KBIT SECURED SERIAL EEPROM  
FEATURES  
DESCRIPTION  
IS23SC1604 is a low-cost, low-power, highly secured  
16K bits (2K x 8) serial EEPROM. It is fabricated using  
ISSI’s advanced CMOS technology.  
• 16K serial EEPROM with security features  
• Comply with ISO/IEC Standard 7816-3  
Synchronous Protocol  
The security features of IS23SC1604 provide high levels  
of memory security protection for smart card applications.  
The memory is partitioned into four application zones.  
Each individual application zone is protected by multiple  
security codes from unauthorized read/write/erase  
access to the zone. In addition, an internal security fuse  
is available for the card issuer to fully personalize the  
device before releasing it to customer.  
• Store and validate security codes  
• Four protected application zones  
• Provide transport code security  
• Single 5V power supply for read/write/erase  
operations  
• Low power operation:  
The device also features an internal high-voltage charge  
pump for memory programming, 1,000,000 write/erase  
cycles and ten years of data retention.  
— 15 µA (max.) standby current  
— 3 mA (max.) read current at 300 KHz  
— 4 mA (max.) write/erase current  
• 2 ms read access time at 300 KHz;  
5 ms write cycle time  
• 300 KHz serial clock rate  
• High ESD protection: > 4 KV  
• High reliability:  
— 1,000,000 erase/write cycles  
— 10 years data retention  
Pin Configuration: 8-pin Plastic DIP  
• Standard CMOS Process  
• Wide operating temperature range  
Vcc  
RST  
CLK  
FUS  
C1  
C2  
C3  
C4  
C5  
C6  
C7  
C8  
GND  
NC  
0°C to +70°C Commercial; –40°C to +85°C  
Industrial  
• Data access only after validation of security  
code  
I/O  
PGM  
• Permanent invalidation of device upon eight  
consecutive failed attempts to enter the correct  
security code  
• Separate read/write/erase access protections  
for each application zone  
• Allow the memory chip to be personalized if the  
internal security fuse is not blown. If the internal  
security fuse is blown, maximum security protection  
of the memory will always be enabled.  
Copyright © 2003 Integrated Silicon Solution, Inc. All rights reserved. ISSI reserves the right to make changes to this specification and its products at any time without notice. ISSI assumes no liability  
arisingoutoftheapplicationoruseofanyinformation, productsorservicesdescribedherein. Customersareadvisedtoobtainthelatestversionofthisdevicespecificationbeforerelyingonany  
publishedinformationandbeforeplacingordersforproducts.  
Integrated Silicon Solution, Inc. — 1-800-379-4774  
ADVANCE INFORMATION Rev. 00E  
1
04/10/03  

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