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IRHM7360SED PDF预览

IRHM7360SED

更新时间: 2024-09-23 14:51:35
品牌 Logo 应用领域
英飞凌 - INFINEON 局域网开关脉冲晶体管
页数 文件大小 规格书
8页 142K
描述
Power Field-Effect Transistor, 22A I(D), 400V, 0.21ohm, 1-Element, N-Channel, Silicon, Metal-oxide Semiconductor FET,

IRHM7360SED 技术参数

是否Rohs认证: 不符合生命周期:Active
Reach Compliance Code:compliant风险等级:5.73
其他特性:HIGH RELIABILITY, RADIATION HARDENED雪崩能效等级(Eas):500 mJ
外壳连接:ISOLATED配置:SINGLE WITH BUILT-IN DIODE
最小漏源击穿电压:400 V最大漏极电流 (ID):22 A
最大漏源导通电阻:0.21 ΩFET 技术:METAL-OXIDE SEMICONDUCTOR
JESD-30 代码:S-MSFM-P3JESD-609代码:e0
元件数量:1端子数量:3
工作模式:ENHANCEMENT MODE封装主体材料:METAL
封装形状:SQUARE封装形式:FLANGE MOUNT
峰值回流温度(摄氏度):NOT SPECIFIED极性/信道类型:N-CHANNEL
最大脉冲漏极电流 (IDM):88 A认证状态:Not Qualified
表面贴装:NO端子面层:TIN LEAD
端子形式:PIN/PEG端子位置:SINGLE
处于峰值回流温度下的最长时间:NOT SPECIFIED晶体管应用:SWITCHING
晶体管元件材料:SILICONBase Number Matches:1

IRHM7360SED 数据手册

 浏览型号IRHM7360SED的Datasheet PDF文件第2页浏览型号IRHM7360SED的Datasheet PDF文件第3页浏览型号IRHM7360SED的Datasheet PDF文件第4页浏览型号IRHM7360SED的Datasheet PDF文件第5页浏览型号IRHM7360SED的Datasheet PDF文件第6页浏览型号IRHM7360SED的Datasheet PDF文件第7页 
PD - 91224C  
REPETITIVE AVALANCHE AND dv/dt RATED  
HEXFET® TRANSISTOR  
IRHM7360SE  
N-CHANNEL  
SINGLE EVENT EFFECT (SEE) RAD HARD  
Product Summary  
Part Number  
400Volt, 0.20, (SEE) RAD HARD HEXFET  
International Rectifier’s (SEE) RAD HARD technology  
HEXFETs demonstrate immunity to SEE failure. Addi-  
tionally, under identical pre- and post-radiation test  
conditions, International Rectifier’s RAD HARD  
HEXFETs retain identical electrical specifications up  
to 1 x 105 Rads (Si) total dose. No compensation in  
gate drive circuitry is required.These devices are also  
capable of surviving transient ionization pulses as high  
as 1 x 1012 Rads (Si)/Sec, and return to normal opera-  
tion within a few microseconds. Since the SEE pro-  
cess utilizes International Rectifier’s patented HEXFET  
technology, the user can expect the highest quality  
and reliability in the industry.  
BVDSS  
RDS(on)  
ID  
IRHM7360SE  
400V  
0.20Ω  
22A  
Features:  
n
n
n
n
n
n
n
n
n
n
n
n
n
Radiation Hardened up to 1 x 105 Rads (Si)  
Single Event Burnout (SEB) Hardened  
Single Event Gate Rupture (SEGR) Hardened  
Gamma Dot (Flash X-Ray) Hardened  
Neutron Tolerant  
Identical Pre- and Post-Electrical Test Conditions  
Repetitive Avalanche Rating  
Dynamic dv/dt Rating  
Simple Drive Requirements  
Ease of Paralleling  
Hermetically Sealed  
RAD HARD HEXFET transistors also feature all of  
the well-established advantages of MOSFETs, such  
as voltage control, very fast switching, ease of paral-  
leling and temperature stability of the electrical pa-  
rameters. They are well-suited for applications such  
as switching power supplies, motor controls, invert-  
ers, choppers, audio amplifiers and high-energy pulse  
circuits in space and weapons environments.  
Electrically Isolated  
Ceramic Eyelets  
Pre-Irradiation  
Absolute Maximum Ratings  
Parameter  
IRHM7360SE  
Units  
I
D
@ V  
= 12V, T = 25°C Continuous Drain Current  
22  
GS  
C
A
I
D
@ V  
= 12V, T = 100°C Continuous Drain Current  
C
14  
GS  
I
Pulsed Drain Current   
Max. Power Dissipation  
Linear Derating Factor  
Gate-to-Source Voltage  
88  
DM  
@ T = 25°C  
P
D
250  
2.0  
W
W/°C  
V
C
V
±20  
500  
22  
GS  
E
Single Pulse Avalanche Energy ‚  
Avalanche Current   
mJ  
A
AS  
I
AR  
E
Repetitive Avalanche Energy   
Peak Diode Recovery dv/dt ƒ  
Operating Junction  
25  
mJ  
V/ns  
AR  
dv/dt  
3.0  
T
-55 to 150  
J
oC  
T
Storage Temperature Range  
Lead Temperature  
STG  
300 (0.063 in. (1.6mm) from  
case for 10 sec.)  
9.3 (typical)  
Weight  
g
www.irf.com  
1
10/13/98  

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