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IRH7450SE PDF预览

IRH7450SE

更新时间: 2024-02-04 07:31:00
品牌 Logo 应用领域
英飞凌 - INFINEON 晶体晶体管开关脉冲局域网
页数 文件大小 规格书
4页 108K
描述
TRANSISTOR N-CHANNEL(BVdss=500V, Rds(on)=0.51ohm, Id=11A)

IRH7450SE 技术参数

是否Rohs认证:不符合生命周期:Active
包装说明:FLANGE MOUNT, O-MBFM-P2Reach Compliance Code:compliant
ECCN代码:EAR99风险等级:5.75
Is Samacsys:N雪崩能效等级(Eas):500 mJ
外壳连接:DRAIN配置:SINGLE WITH BUILT-IN DIODE
最小漏源击穿电压:500 V最大漏极电流 (ID):12 A
最大漏源导通电阻:0.57 ΩFET 技术:METAL-OXIDE SEMICONDUCTOR
JEDEC-95代码:TO-204AEJESD-30 代码:O-MBFM-P2
元件数量:1端子数量:2
工作模式:ENHANCEMENT MODE封装主体材料:METAL
封装形状:ROUND封装形式:FLANGE MOUNT
峰值回流温度(摄氏度):NOT SPECIFIED极性/信道类型:N-CHANNEL
最大脉冲漏极电流 (IDM):48 A表面贴装:NO
端子形式:PIN/PEG端子位置:BOTTOM
处于峰值回流温度下的最长时间:NOT SPECIFIED晶体管应用:SWITCHING
晶体管元件材料:SILICONBase Number Matches:1

IRH7450SE 数据手册

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Previous Datasheet  
Index  
Next Data Sheet  
Provisional Data Sheet No. PD 9.1390  
IRH7450SE  
REPETITIVE AVALANCHE AND dv/dt RATED  
HEXFET® TRANSISTOR  
N-CHANNEL  
SINGLE EVENT EFFECT (SEE) RAD HARD  
500 Volt, 0.51, (SEE) RAD HARD HEXFET  
Product Summary  
Part Number  
International Rectifier’s (SEE) RAD HARD technology  
HEXFETs demonstrate virtual immunity to SEE fail-  
ure.Additionally, under identical pre- and post-radia-  
tion test conditions, International Rectifier’s RAD HARD  
HEXFETs retain identical electrical specifications up  
to 1 x 105 Rads (Si) total dose. No compensation in  
gate drive circuitry is required.These devices are also  
capable of surviving transient ionization pulses as high  
as 1 x 1012 Rads (Si)/Sec, and return to normal opera-  
tion within a few microseconds. Since the (SEE) pro-  
cess utilizes International Rectifier’s patented HEXFET  
technology, the user can expect the highest quality and  
reliability in the industry.  
BVDSS  
RDS(on)  
ID  
IRH7450SE  
500V  
0.51Ω  
11A  
Features:  
n
n
n
n
n
n
n
n
n
n
n
Radiation Hardened up to 1 x 105 Rads (Si)  
Single Event Burnout (SEB) Hardened  
Single Event Gate Rupture (SEGR) Hardened  
Gamma Dot (Flash X-Ray) Hardened  
Neutron Tolerant  
Identical Pre- and Post-Electrical Test Conditions  
Repetitive Avalanche Rating  
Dynamic dv/dt Rating  
Simple Drive Requirements  
Ease of Paralleling  
Hermetically Sealed  
RAD HARD HEXFET transistors also feature all of  
the well-established advantages of MOSFETs, such  
as voltage control, very fast switching, ease of paral-  
leling and temperature stability of the electrical pa-  
rameters.  
They are well-suited for applications such as switch-  
ing power supplies, motor controls, inverters, chop-  
pers, audio amplifiers and high-energy pulse circuits  
in space and weapons environments.  
Absolute Maximum Ratings  
Pre-Radiation  
Parameter  
IRH7450SE  
Units  
I
D
@ V  
= 12V, T = 25°C Continuous Drain Current  
11  
GS  
C
A
I
D
@ V  
= 12V, T = 100°C Continuous Drain Current  
C
7.0  
GS  
I
Pulsed Drain Current   
Max. Power Dissipation  
Linear Derating Factor  
Gate-to-Source Voltage  
44  
DM  
@ T = 25°C  
P
D
150  
1.2  
W
W/K ꢀ  
V
C
V
±20  
500  
11  
GS  
E
Single Pulse Avalanche Energy ‚  
Avalanche Current   
mJ  
AS  
I
A
AR  
E
Repetitive Avalanche Energy   
Peak Diode Recovery dv/dt ƒ  
Operating Junction  
15  
mJ  
AR  
dv/dt  
3.5  
V/ns  
T
-55 to 150  
J
T
Storage Temperature Range  
oC  
g
STG  
(0.0063 in. (1.6mm) from case for 10 sec.)  
11.5 (typical)  
Lead Temperature  
Weight  
300  
To Order  
 
 

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