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IRFW150A PDF预览

IRFW150A

更新时间: 2024-09-16 10:22:31
品牌 Logo 应用领域
飞兆/仙童 - FAIRCHILD /
页数 文件大小 规格书
7页 254K
描述
Power Field-Effect Transistor, 5.6A I(D), 100V, 0.4ohm, 1-Element, N-Channel, Silicon, Metal-oxide Semiconductor FET, D2PAK-3

IRFW150A 数据手册

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IRFW/I510A  
Advanced Power MOSFET  
FEATURES  
BVDSS = 100 V  
Avalanche Rugged Technology  
Rugged Gate Oxide Technology  
Lower Input Capacitance  
W
RDS(on) = 0.4  
ID = 5.6 A  
Improved Gate Charge  
Extended Safe Operating Area  
D2-PAK  
I2-PAK  
O
C
175 Operating Temperature  
2
m
Lower Leakage Current : 10 A (Max.) @ VDS = 100V  
W
Lower RDS(ON) : 0.289 (Typ.)  
1
1
2
3
3
1. Gate 2. Drain 3. Source  
Absolute Maximum Ratings  
Symbol  
Characteristic  
Drain-to-Source Voltage  
Value  
100  
5.6  
4
Units  
VDSS  
V
O
Continuous Drain Current (TC=25 C)  
ID  
A
O
Continuous Drain Current (TC=100 C)  
1
IDM  
VGS  
EAS  
IAR  
Drain Current-Pulsed  
20  
A
V
O
Gate-to-Source Voltage  
Single Pulsed Avalanche Energy  
Avalanche Current  
+
_
20  
63  
2
mJ  
A
O
1
5.6  
3.3  
6.5  
3.8  
33  
O
EAR  
dv/dt  
1
Repetitive Avalanche Energy  
mJ  
V/ns  
W
O
3
Peak Diode Recovery dv/dt  
O
O
*
)
Total Power Dissipation (TA=25  
Total Power Dissipation (TC=25  
Linear Derating Factor  
C
O
PD  
)
C
W
O
0.22  
W/ C  
Operating Junction and  
TJ , TSTG  
- 55 to +175  
Storage Temperature Range  
O
C
Maximum Lead Temp. for Soldering  
Purposes, 1/8” from case for 5-seconds  
TL  
300  
Thermal Resistance  
Symbol  
Characteristic  
Typ.  
Max.  
Units  
Rq  
Junction-to-Case  
--  
--  
--  
4.51  
40  
JC  
O
Rq  
*
Junction-to-Ambient  
Junction-to-Ambient  
/W  
C/  
JA  
Rq  
62.5  
JA  
*
When mounted on the minimum pad size recommended (PCB Mount).  
Rev. B  
©1999 Fairchild Semiconductor Corporation  

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