SC70
Package
INA210, INA211
INA212, INA213
INA214
www.ti.com ....................................................................................................................................................................................................... SBOS437–MAY 2008
Voltage Output, High or Low Side Measurement,
Bi-Directional Zerø-Drift Series
CURRENT SHUNT MONITOR
1
FEATURES
APPLICATIONS
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•
•
•
•
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NOTEBOOK COMPUTERS
CELL PHONES
TELECOM EQUIPMENT
POWER MANAGEMENT
BATTERY CHARGERS
WELDING EQUIPMENT
2
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WIDE COMMON-MODE RANGE: –0.3V to 26V
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OFFSET VOLTAGE: ±35µV (Max, INA210)
(Enables shunt drops of 10mV full-scale)
ACCURACY
–
–
–
±1% Gain Error (Max over temperature)
0.5µV/°C Offset Drift (Max)
10ppm/°C Gain Drift (Max)
DESCRIPTION
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CHOICE OF GAINS:
The INA210, INA211, INA212, INA213, and INA214
are voltage output current shunt monitors that can
sense drops across shunts at common-mode
voltages from –0.3V to 26V, independent of the
supply voltage. Five fixed gains are available: 50V/V,
100V/V, 200V/V, 500V/V, or 1000V/V. The low offset
of the Zerø-Drift architecture enables current sensing
with maximum drops across the shunt as low as
10mV full-scale.
–
–
–
–
–
INA210: 200V/V
INA211: 500V/V
INA212: 1000V/V
INA213: 50V/V
INA214: 100V/V
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QUIESCENT CURRENT: 100µA (max)
SC70 package
These devices operate from a single +2.7V to +26V
power supply, drawing a maximum of 100µA of
supply current. All versions are specified over the
extended operating temperature range (–40°C to
+125°C), and offered in an SC70 package.
RSHUNT
Supply
Load
Reference
Voltage
Output
INA21x
OUT
REF
R1
R3
IN-
GND
+2.7V to +26V
IN+
V+
PRODUCT
GAIN
R3 and R4
R1 and R2
R2
R4
INA210
INA211
INA212
INA213
INA214
200
500
1000
50
5kW
2kW
1MW
1MW
1MW
1MW
1MW
CBYPASS
0.01mF
to
1kW
20kW
10kW
0.1mF
100
1
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Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
2
All trademarks are the property of their respective owners.
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of the Texas
Instruments standard warranty. Production processing does not
necessarily include testing of all parameters.
Copyright © 2008, Texas Instruments Incorporated