QFN
Package
SC70
Package
INA199A1
INA199A2
INA199A3
www.ti.com
SBOS469B –MAY 2009–REVISED FEBRUARY 2010
Voltage Output, High or Low Side Measurement, Bi-Directional Zerø-Drift Series
CURRENT SHUNT MONITOR
Check for Samples: INA199A1, INA199A2, INA199A3
1
FEATURES
DESCRIPTION
2
•
WIDE COMMON-MODE RANGE: –0.3V to 26V
The INA199Ax series of voltage output current shunt
monitors can sense drops across shunts at
common-mode voltages from –0.3V to 26V,
independent of the supply voltage. Three fixed gains
are available: 50V/V, 100V/V, and 200V/V. The low
offset of the Zerø-Drift architecture enables current
sensing with maximum drops across the shunt as low
as 10mV full-scale.
•
•
OFFSET VOLTAGE: ±150mV (Max)
(Enables shunt drops of 10mV full-scale)
ACCURACY
–
–
–
±1.5% Gain Error (Max over temperature)
0.5mV/°C Offset Drift (Max)
10ppm/°C Gain Drift (Max)
These devices operate from a single +2.7V to +26V
power supply, drawing a maximum of 100mA of
supply current. All versions are specified from –40°C
to +105°C, and offered in both SC70 and thin
QFN-10 packages.
•
CHOICE OF GAINS:
–
–
–
INA199A1: 50V/V
INA199A2: 100V/V
INA199A3: 200V/V
•
•
QUIESCENT CURRENT: 100mA (max)
PRODUCT FAMILY TABLE
PACKAGES: SC70, THIN QFN-10
PRODUCT
INA199A1
INA199A2
INA199A3
GAIN
R3 AND R4
R1 AND R2
1MΩ
50
20kΩ
APPLICATIONS
100
200
10kΩ
1MΩ
•
•
•
•
•
•
NOTEBOOK COMPUTERS
CELL PHONES
TELECOM EQUIPMENT
POWER MANAGEMENT
BATTERY CHARGERS
WELDING EQUIPMENT
5kΩ
1MΩ
RSHUNT
Supply
Load
Reference
Voltage
Output
INA199Ax
OUT
REF
R1
R3
IN-
GND
+2.7V to +26V
IN+
V+
R2
R4
CBYPASS
0.01mF
to
0.1mF
1
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas
Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
2
All trademarks are the property of their respective owners.
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of the Texas
Instruments standard warranty. Production processing does not
necessarily include testing of all parameters.
Copyright © 2009–2010, Texas Instruments Incorporated