INA193, INA194
INA195, INA196
INA197, INA198
www.ti.com
SBOS307F –MAY 2004–REVISED FEBRUARY 2010
CURRENT SHUNT MONITOR
−16V to +80V Common-Mode Range
Check for Samples: INA193, INA194, INA195, INA196, INA197, INA198
1
FEATURES
DESCRIPTION
2
•
WIDE COMMON-MODE VOLTAGE:
The INA193−INA198 family of current shunt monitors
with voltage output can sense drops across shunts at
common-mode voltages from −16V to +80V,
independent of the INA19x supply voltage. They are
available with three output voltage scales: 20V/V,
50V/V, and 100V/V. The 500kHz bandwidth simplifies
use in current control loops. The INA193−INA195
provide identical functions but alternative pin
configurations to the INA196−INA198, respectively.
−16V to +80V
•
•
•
LOW ERROR: 3.0% Over Temp (max)
BANDWIDTH: Up to 500kHz
THREE TRANSFER FUNCTIONS AVAILABLE:
20V/V, 50V/V, and 100V/V
•
•
QUIESCENT CURRENT: 900mA (max)
COMPLETE CURRENT SENSE SOLUTION
The INA193−INA198 operate from a single +2.7V to
+18V supply, drawing a maximum of 900mA of supply
current. They are specified over the extended
operating temperature range (−40°C to +125°C), and
are offered in a space-saving SOT23 package.
APPLICATIONS
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•
•
•
•
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WELDING EQUIPMENT
NOTEBOOK COMPUTERS
CELL PHONES
TELECOM EQUIPMENT
AUTOMOTIVE
MODEL
INA193
INA194
INA195
INA196
INA197
INA198
GAIN
PACKAGE
SOT23-5
SOT23-5
SOT23-5
SOT23-5
SOT23-5
SOT23-5
PINOUT(1)
Pinout #1
Pinout #1
Pinout #1
Pinout #2
Pinout #2
Pinout #2
20V/V
50V/V
100V/V
20V/V
50V/V
100V/V
POWER MANAGEMENT
BATTERY CHARGERS
IS
RS
VIN+
-16V to +80V
V+
+2.7V to +18V
(1) See Pin Assignments for Pinout #1 and Pinout #2.
VIN+
VIN-
Negative
and
Load
R1
R1
Positive
Common-Mode
Voltage
A1
A2
OUT
RL
INA193-INA198
1
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Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
2
All trademarks are the property of their respective owners.
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of the Texas
Instruments standard warranty. Production processing does not
necessarily include testing of all parameters.
Copyright © 2004–2010, Texas Instruments Incorporated