INA129-EP
www.ti.com
SBOS508 –DECEMBER 2009
PRECISION, LOW POWER INSTRUMENTATION AMPLIFIERS
Check for Samples: INA129-EP
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FEATURES
SUPPORTS DEFENSE, AEROSPACE
AND MEDICAL APPLICATIONS
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Low Offset Voltage
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Controlled Baseline
One Assembly/Test Site
One Fabrication Site
Available in Military (–55°C/125°C)
Temperature Range(1)
Low Input Bias Current
High CMR
Inputs Protected to ±40 V
Wide Supply Range: ±2.25 V to ±18 V
Low Quiescent Current
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Extended Product Life Cycle
Extended Product-Change Notification
Product Traceability
APPLICATIONS
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Bridge Amplifier
Thermocouple Amplifier
RTD Sensor Amplifier
Medical Instrumentation
Data Acquisition
D PACKAGE
(TOP VIEW)
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RG
RG
V+
VO
Ref
V- IN
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IN
V-
(1) Custom temperature ranges available
DESCRIPTION
The INA129 is a low power, general purpose instrumentation amplifier offering excellent accuracy. The versatile
3-op amp design and small size make it ideal for a wide range of applications. Current-feedback input circuitry
provides wide bandwidth even at high gain (200 kHz at G = 100).
A single external resistor sets any gain from 1 to 10,000. The INA129 provides an industry-standard gain
equation; the INA129 gain equation is compatible with the AD620.
The INA129 is laser trimmed for very low offset voltage, drift and high common-mode rejection (113 dB at
G ≥ 100). It operates with power supplies as low as ±2.25 V, and quiescent current is only 750 μA - ideal for
battery operated systems. Internal input protection can withstand up to ±40 V without damage.
The INA129 is available in an SO-8 surface-mount package specified for the –55°C to 125°C temperature range.
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Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas
Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
PRODUCTION DATA information is current as of publication date.
Copyright © 2009, Texas Instruments Incorporated
Products conform to specifications per the terms of the Texas
Instruments standard warranty. Production processing does not
necessarily include testing of all parameters.