IDT54/74FCT162511AT/CT
FAST CMOS 16-BIT
REGISTERED/LATCHED
TRANSCEIVER WITH PARITY
Integrated Device Technology, Inc.
FEATURES:
• 0.5 MICRON CMOS Technology
typelatchesandD-typeflip-flopstoallowdataflowintranspar-
ent, latched or clocked modes. The device has a parity
generator/cheker in the A-to-B direction and a parity checker
in the B-to-A direction. Error checking is done at the byte level
with separate parity bits for each byte. Separate error flags
exits for each direction with a single error flag indicating an
error for either byte in the A-to-B direction and a second error
flag indicating an error for either byte in the B-to-A direction.
The parity error flags are open drain outputs which can be tied
together and/or tied with flags from other devices to form a
single error flag or interrupt. The parity error flags are enabled
by the OExx control pins allowing the designer to disable the
error flag during combinational transitions.
• Typical tsk(o) (Output Skew) < 250ps, clocked mode
• Low input and output leakage ≤1µA (max)
• ESD > 2000V per MIL-STD-883, Method 3015;
> 200V using machine model (C = 200pF, R = 0)
• Packagesinclude25milpitchSSOP,19.6milpitchTSSOP,
15.7 mil pitch TVSOP and 25 mil pitch Cerpack
• Extended commercial range of –40°C to +85°C
• VCC = 5V ±10%
• Balanced Output Drivers:
±24mA (commercial)
±16mA (military)
• Series current limiting resistors
The control pins LEAB, CLKAB and OEAB control opera-
tion in the A-to-B direction while LEBA, CLKBA and OEBA
controltheB-to-Adirection. GEN/CHKisonlyfortheselection
of A-to-B operation, the B-to-A direction is always in checking
mode. The ODD/EVEN select is common between the two
directions. Except for the ODD/EVEN control, independent
operation can be achieved between the two directions by
using the corresponding control lines.
• Generate/Check, Check/Check modes
• Open drain parity error allows wire-OR
DESCRIPTION:
TheFCT162511AT/CT16-bitregistered/latchedtransceiver
with parity is built using advanced dual metal CMOS technol-
ogy. This high-speed, low-power transceiver combines D-
SIMPLIFIED FUNCTIONAL BLOCK DIAGRAM:
LEAB
CLKAB
Data
OEAB
Parity, data
B0-15
16
18
PB1,2
Parity
Latch/
Register
GEN/CHK
2
Byte
Parity
PERB
Generator/
Checker
A0-15
PA1,2
(Open Drain)
ODD/EVEN
LEBA
CLKBA
Parity, Data
Parity, data
18
18
Latch/
Register
OEBA
Byte
Parity
Checking
PERA
(Open Drain)
2916 drw 01
The IDT logo is a registered trademark of Integrated Device Technology, Inc.
MILITARY AND COMMERCIAL TEMPERATURE RANGES
AUGUST 1996
1996 Integrated Device Technology, Inc.
5.11
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