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IDT74FCT162511CTE PDF预览

IDT74FCT162511CTE

更新时间: 2024-10-27 23:12:47
品牌 Logo 应用领域
艾迪悌 - IDT /
页数 文件大小 规格书
11页 208K
描述
FAST CMOS 16-BIT REGISTERED/LATCHED TRANSCEIVER WITH PARITY

IDT74FCT162511CTE 技术参数

是否无铅: 含铅是否Rohs认证: 不符合
生命周期:Obsolete零件包装代码:DFP
包装说明:DFP,针数:56
Reach Compliance Code:compliantHTS代码:8542.39.00.01
风险等级:5.89其他特性:INDEPENDENT OUTPUT ENABLE FOR EACH DIRECTION; PARITY GENERATION/ERROR DETECTION A TO B
系列:FCTJESD-30 代码:R-GDFP-F56
JESD-609代码:e0长度:18.415 mm
负载电容(CL):50 pF逻辑集成电路类型:REGISTERED BUS TRANSCEIVER
位数:16功能数量:1
端口数量:2端子数量:56
最高工作温度:85 °C最低工作温度:-40 °C
输出特性:3-STATE WITH SERIES RESISTOR输出极性:TRUE
封装主体材料:CERAMIC, GLASS-SEALED封装代码:DFP
封装形状:RECTANGULAR封装形式:FLATPACK
峰值回流温度(摄氏度):225传播延迟(tpd):5.3 ns
认证状态:Not Qualified座面最大高度:2.413 mm
最大供电电压 (Vsup):5.5 V最小供电电压 (Vsup):4.5 V
标称供电电压 (Vsup):5 V表面贴装:YES
技术:CMOS温度等级:INDUSTRIAL
端子面层:TIN LEAD端子形式:FLAT
端子节距:0.635 mm端子位置:DUAL
处于峰值回流温度下的最长时间:30宽度:9.652 mm
Base Number Matches:1

IDT74FCT162511CTE 数据手册

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IDT54/74FCT162511AT/CT  
FAST CMOS 16-BIT  
REGISTERED/LATCHED  
TRANSCEIVER WITH PARITY  
Integrated Device Technology, Inc.  
FEATURES:  
• 0.5 MICRON CMOS Technology  
typelatchesandD-typeflip-flopstoallowdataflowintranspar-  
ent, latched or clocked modes. The device has a parity  
generator/cheker in the A-to-B direction and a parity checker  
in the B-to-A direction. Error checking is done at the byte level  
with separate parity bits for each byte. Separate error flags  
exits for each direction with a single error flag indicating an  
error for either byte in the A-to-B direction and a second error  
flag indicating an error for either byte in the B-to-A direction.  
The parity error flags are open drain outputs which can be tied  
together and/or tied with flags from other devices to form a  
single error flag or interrupt. The parity error flags are enabled  
by the OExx control pins allowing the designer to disable the  
error flag during combinational transitions.  
• Typical tsk(o) (Output Skew) < 250ps, clocked mode  
• Low input and output leakage 1µA (max)  
• ESD > 2000V per MIL-STD-883, Method 3015;  
> 200V using machine model (C = 200pF, R = 0)  
• Packagesinclude25milpitchSSOP,19.6milpitchTSSOP,  
15.7 mil pitch TVSOP and 25 mil pitch Cerpack  
• Extended commercial range of –40°C to +85°C  
• VCC = 5V ±10%  
• Balanced Output Drivers:  
±24mA (commercial)  
±16mA (military)  
• Series current limiting resistors  
The control pins LEAB, CLKAB and OEAB control opera-  
tion in the A-to-B direction while LEBA, CLKBA and OEBA  
controltheB-to-Adirection. GEN/CHKisonlyfortheselection  
of A-to-B operation, the B-to-A direction is always in checking  
mode. The ODD/EVEN select is common between the two  
directions. Except for the ODD/EVEN control, independent  
operation can be achieved between the two directions by  
using the corresponding control lines.  
• Generate/Check, Check/Check modes  
• Open drain parity error allows wire-OR  
DESCRIPTION:  
TheFCT162511AT/CT16-bitregistered/latchedtransceiver  
with parity is built using advanced dual metal CMOS technol-  
ogy. This high-speed, low-power transceiver combines D-  
SIMPLIFIED FUNCTIONAL BLOCK DIAGRAM:  
LEAB  
CLKAB  
Data  
OEAB  
Parity, data  
B0-15  
16  
18  
PB1,2  
Parity  
Latch/  
Register  
GEN/CHK  
2
Byte  
Parity  
PERB  
Generator/  
Checker  
A0-15  
PA1,2  
(Open Drain)  
ODD/EVEN  
LEBA  
CLKBA  
Parity, Data  
Parity, data  
18  
18  
Latch/  
Register  
OEBA  
Byte  
Parity  
Checking  
PERA  
(Open Drain)  
2916 drw 01  
The IDT logo is a registered trademark of Integrated Device Technology, Inc.  
MILITARY AND COMMERCIAL TEMPERATURE RANGES  
AUGUST 1996  
1996 Integrated Device Technology, Inc.  
5.11  
DSC–2916/5  
1

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