Test Contactors
IC299 Series
IC299- 100 30
Characteristics
1,000MΩminimum at 500 VDC
Socket Series
Insulation Resistance:
Withstanding Voltage:
Contact Resistance:
Operating Temperature:
500 VAC for 1 Minute
30mΩ max. at 10mA/20mV (Initial)
-30˚C ~ +125˚C
No. of Leads
Design No.
Material
Insulator:
Contact:
Plating:
PEI (Glass Filled)
Micro Spring Probes
Gold over Nickel
NOTE:
High speed / low inductance
QFP and SOP’s.
DESCRIPTION
Test contactor sockets from Yamaichi are ideal for automated or manual testing of BGA, LGA and other packages such as
CSP with micro miniature balls down to .3mm in diameter, QFP and other gullwing leaded IC’s.
These test contactors combine a low profile, small body with long life and excellent electrical characteristics as expected
in today’s increasingly advanced and specialized test environments.
Each test contactor is designed and manufactured with or without a lid for your specific device testing application, taking
any special requirement into consideration.
The 299 series has been designed to test very high frequency QFP devices, up to 10Ghz. The 299 series uses gullwing
shaped leads and a specially designed V-shaped rocker style contact allows for a low inductance of 1nH.
ORDERING PROCEDURE
Note: Each Test Contactor Socket is custom built.
Part numbers listed are socket configurations previously designed and manufactured by Yamaichi for a specific device.
Caution: Even if a device configuration matches the pin count and pitch shown in the listing it is strongly recommended to
contact the factory prior to selecting and ordering any socket.
The customer must specify only the Socket Series Number of choice in addition to providing all device parameters and
special requirements. The final part number will be determined by Yamaichi.
131