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HVV1012-100 PRODUCT OVERVIEW
TM
L-Band Avionics Pulsed Power Transistor
1025-1150MHz, 10μs Pulse, 1% Duty
for DME and TCAS Applications
DESCRIPTION
PaCKaGE
The high power HVV1012-100 device is a high voltage
silicon enhancement mode RF transistor designed for
L-Band pulsed avionics applications operating over
the frequency range from 1025MHz to 1150MHz.
FEaTURES
• High Power Gain
• Excellent Ruggedness
• 48V Supply Voltage
The device resides in a two-lead metal flanged package
with liquid crystal polymer lid. The HV400 package style is
qualified for gross leak test – MIL-STD-883, Method 1014.
aBSOLUTE MaXIMUM RaTINGS
Symbol Parameter
Value
95
Drain-Source Voltage 105
Unit
V
V
A
W
°C
VDSS
VGS
Gate-Source Voltage
Drain Current
Power Dissipation
10
8
1250
RUGGEDNESS
IDSX
2
PD
The HVV1012-100 device is capable of withstanding an
output load mismatch corresponding to a 20:1 VSWR at
rated output power and operating voltage across the fre-
quency band of operation.
TS
Storage Temperature -65 to
+200
TJ
Junction
Temperature
200
°C
Symbol Parameter
Test Condition
POUT = 100W
Max
20:1
Units
VSWR
LMT1
Load
Mismatch
Tolerance
THERMaL CHaRaCTERISTICS
F = 1150 MHz
Symbol Parameter
Max
0.14
Unit
°C/W
1
LJJC
Thermal Resistance
ELECTRICaL CHaRaCTERISTICS
Symbol
VBR(DSS)
IDSS
Parameter
Conditions
VGS=0V,ID=1mA
VGS=0V,VDS=48V
VGS=5V,VDS=0V
POUT=100W,F=1025,1150MHz
POUT=100W,F=1025,1150MHz
POUT=100W,F=1025,1150MHz
POUT=100W,F=1025,1150MHz
Typ
Units
V
µA
µA
dB
dB
%
3mA
102
110
Drain-Source Breakdown
Drain Leakage Current
Gate Leakage Current
Power Gain
Input Return Loss
Drain Efficiency
<80
<10
IGSS
<1
20.5
11
50
<0.3
GP1
IRL1
1
džD
PD1
Pulse Droop
dB
1Under Pulse Conditions: Pulse Width = 10µsec, Pulse Duty Cycle = 1% at VDD = 48V, IDQ = 50mA
2Rated at TCASE = 25°
For additional information:
HVVi Semiconductors, Inc.
EG-01-PO04X5
Tel: (866) 429-HVVi (4884) or visit www.hvvi.com
10235 S. 51st St. Suite 100
10/13/08
1
© 2008 HVVi Semiconductors, Inc. All Rights Reserved.
Phoenix, AZ. 85044