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HV2116 PDF预览

HV2116

更新时间: 2024-09-21 04:22:31
品牌 Logo 应用领域
超科 - SUPERTEX 开关高压
页数 文件大小 规格书
9页 91K
描述
8-Channel High Voltage Analog Switch

HV2116 数据手册

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HV2116  
8-Channel High Voltage Analog Switch  
Ordering Information  
Package Options  
VPP – VNN  
28-lead plastic  
chip carrier  
Die  
160V  
HV2116PJ  
HV2116X  
Features  
General Description  
Not recommended for new designs. Please use HV202  
HVCMOS® technology for high performance  
instead.  
Very low quiescent power dissipation – 10µA  
Output On-resistance typically 22 ohms  
Low parasitic capacitances  
Thisdeviceisan8-channelhigh-voltageanalogswitchintegrated  
circuit (IC) intended for use in applications requiring high voltage  
switching controlled by low voltage control signals, such as ultra-  
sound imaging and printers. Input data is shifted into an 8-bit shift  
register which can then be retained in an 8-bit latch. To reduce  
any possible clock feedthrough noise, Latch Enable (LE) should  
be left high until all bits are clocked in. Using HVCMOS technol-  
ogy, this switch combines high voltage bilateral DMOS switches  
and low power CMOS logic to provide efficient control of high  
voltage analog signals.  
DC to 10MHz analog signal frequency  
-50dB typical output off isolation at 5MHz  
CMOS logic circuitry for low power  
Excellent noise immunity  
On-chip shift register, and latch logic circuitry  
Flexible high voltage supplies  
This IC is suitable for various combinations of high voltage sup-  
plies,e.g.,forHV2116 +40V/-120V,or+80V/-80Vor+150V/-10V.  
Surface mount package available  
13  
13  
Absolute Maximum Ratings*  
VDDlogic power supply voltage  
-0.5V to +18V  
VPP - VNN supply voltage  
174V  
VPP positive high voltage supply  
VNN Negative high voltage supply  
Logic input voltages  
-0.5V to +160V  
+0.5V to -160V  
-0.5V to VDD +0.3V  
VNN to VPP  
Analog signal range  
Peak analog signal current/channel  
Storage temperature  
3.0A  
-65°C to +150°C  
1.2W  
Power dissipation  
*Absolute Maximum Ratings are those values beyond which damage to the  
device may occur. Functional operation under these conditions is not implied.  
Continuous operation of the device at the absolute rating level may affect  
device reliability.  
13-57  

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