PD - 94413
HF15D060ACE
Hexfred Die in Wafer Form
600V
Features
• GEN3 Hexfred Technology
I
F(nom)=15A
• Low VF
• Low IRR
• Low tRR
V
F(typ)= 1.2V @ IF(nom) @ 25°C
• Soft Reverse Recovery
Motor Control Antiparallel Diode
125mm Wafer
Benefits
• Benchmark Efficiency for Motor Control Applications
• Rugged Transient Performance
• Low EMI
Reference Standard IR Package Part: IRGS15B60KD
• Excellent Current Sharing in Parallel Operation
• Qualified for Industrial Market
Electrical Characteristics (Wafer Form)
Parameter
Description
Guaranteed (min, max)
Test Conditions
VF
Forward Voltage Drop
0.8V min, 1.1V max
600V min
IC = 3A, TJ = 25°C
BVR
IRM
Reverse Breakdown Voltage
Reverse Leakage Current
TJ = 25°C, IR = 1mA
TJ = 25°C, VR = 600V
15µA max
Mechanical Data
Nominal Backmetal Composition, (Thickness)
Nominal Front Metal Composition, (Thickness)
Dimensions
Cr- Ni - Ag, (1kA - 4kA - 6kA)
99% Al/1% Si, (3µm)
0.085'' x 0.130"
Wafer Diameter
125mm, with std. < 100 > flat
381µm, +/-15µm
Wafer Thickness, Tolerance
Relevant Die Mechanical Dwg. Number
Minimum Street Width
01-5509
100µm
Reject Ink Dot Size
0.25mm diameter minimum
Consistent throughout same wafer lot
Store in original container, in dessicated
nitrogen, with no contamination
For optimum electrical results, die attach
temperature should not exceed 300°C
Ink Dot Location
Recommended Storage Environment
Recommended Die Attach Conditions
Die Outline
www.irf.com
1
04/19/02